arXiv subjects

Wilhelm Eschen

Publications and source records attributed to Wilhelm Eschen.

10 recordsLinked to original sources

arXiv2025

Quantitative EUV ptychography reveals nanoscale morphological responses of bacteria under physiological and antibiotic stress

Table-top extreme ultraviolet (EUV) ptychography enables nanoscale, label-free, and quantitative imaging with intrinsic elemental sensitivity, offering a unique modality for subcellular profiling of bacterial morphology and composition. In this work, we apply a state-of-the-art EUV ptychographic microscope to systematically investigate the structural and compositional features of two model prokaryotic bacteria, Escherichia coli and Bacillus subtilis. With quantitative amplitude and phase reconstructions at 44 nm resolution on a tabletop, we visualize subtle phenomena during bacterial sporulation based on distinct morphological signatures. Notably, we examine the single-cell response of B. subtilis to the antibiotic monazomycin, uncovering ultrastructural disruption and compositional alterations. To further characterize the phenotypic variations, we perform multivariate statistical analysis on extracted morphological features, revealing diversity and clustering patterns associated with defined biological states. This work establishes EUV ptychography as a powerful, element-sensitive imaging platform for label-free bacterial imaging, showcasing its promise for biomedical and antimicrobial research.

physics.bio-ph↗

arXiv2024

Bayesian multi-exposure image fusion for robust high dynamic range ptychography

The limited dynamic range of the detector can impede coherent diffractive imaging (CDI) schemes from achieving diffraction-limited resolution. To overcome this limitation, a straightforward approach is to utilize high dynamic range (HDR) imaging through multi-exposure image fusion (MEF). This method involves capturing measurements at different exposure times, spanning from under to overexposure and fusing them into a single HDR image. The conventional MEF technique in ptychography typically involves subtracting the background noise, ignoring the saturated pixels and then merging the acquisitions. However, this approach is inadequate under conditions of low signal-to-noise ratio (SNR). Additionally, variations in illumination intensity significantly affect the phase retrieval process. To address these issues, we propose a Bayesian MEF modeling approach based on a modified Poisson distribution that takes the background and saturation into account. To infer the model parameters, the expectation-maximization (EM) algorithm is employed. As demonstrated with synthetic and experimental data, our approach outperforms the conventional MEF method, offering superior phase retrieval under challenging experimental conditions. This work underscores the significance of robust multi-exposure image fusion for ptychography, particularly in imaging shot-noise-dominated weakly scattering specimens or in cases where access to HDR detectors with high SNR is limited. Furthermore, the applicability of the Bayesian MEF approach extends beyond CDI to any imaging scheme that requires HDR treatment. Given this versatility, we provide the implementation of our algorithm as a Python package.

eess.IV↗

arXiv2023

Broadband ptychography using curved wavefront illumination

We examine the interplay between spectral bandwidth and illumination curvature in ptychography. By tailoring the divergence of the illumination, broader spectral bandwidths can be tolerated without requiring algorithmic modifications to the forward model. In particular, a strong wavefront curvature transitions a far-field diffreaction geometry to an effectively near-field one, which is lees affected by temporal coherence effects. The relaxed temporal coherence requirements allow for leveraging wider spectral bandwidths and larger illumination spots. Our findings open up new avenues towards utilizing pink and broadband beams for increased flux and throughput at both synchrotron facilities and lab-scale beamlines.

physics.optics↗

arXiv2023

High-speed and wide-field nanoscale table-top ptychographic EUV imaging and beam characterization with a sCMOS detector

We present high-speed and wide-field EUV ptychography at 13.5 nm wavelength using a table-top high-order harmonic source. By employing a scientific complementary metal oxide semiconductor (sCMOS) detector the scan time for sub-20 nm high-resolution measurements were significantly reduced by up to a factor of five. The fast frame rate of sCMOS enables wide-field imaging with a field of view of 100 μm x 100 μm with an imaging speed of 4.6 Mpix/h. Furthermore, fast EUV wavefront characterization is employed using a combination of the sCMOS detector with orthogonal probe relaxation.

physics.ins-det↗

arXiv2023

PtyLab.m/py/jl: a cross-platform, open-source inverse modeling toolbox for conventional and Fourier ptychography

Conventional (CP) and Fourier (FP) ptychography have emerged as versatile quantitative phase imaging techniques. While the main application cases for each technique are different, namely lens-less short wavelength imaging for CP and lens-based visible light imaging for FP, both methods share a common algorithmic ground. CP and FP have in part independently evolved to include experimentally robust forward models and inversion techniques. This separation has resulted in a plethora of algorithmic extensions, some of which have not crossed the boundary from one modality to the other. Here, we present an open source, cross-platform software, called PtyLab, enabling both CP and FP data analysis in a unified framework. With this framework, we aim to facilitate and accelerate cross-pollination between the two techniques. Moreover, the availability in Matlab, Python, and Julia will set a low barrier to enter each field.

physics.comp-ph↗

arXiv2022

Visualizing the ultra-structure of microorganisms using table-top extreme ultraviolet imaging

Table-top extreme ultraviolet (EUV) microscopy offers unique opportunities for label-free investigation of biological samples. Here, we demonstrate ptychographic EUV imaging of two dried, unstained model specimens: germlings of a fungus (Aspergillus nidulans), and bacteria (Escherichia coli) cells at 13.5 nm wavelength. We find that the EUV spectral region, which to date has not received much attention for biological imaging, offers sufficient penetration depths for the identification of intracellular features. By implementing a position-correlated ptychography approach, we demonstrate a millimeter-squared field of view enabled by infrared illumination combined with sub-60 nm spatial resolution achieved with EUV illumination on selected regions of interest. The strong element contrast at 13.5 nm wavelength enables the identification of the nanoscale material composition inside the specimens. Our work will advance and facilitate EUV imaging applications and enable further possibilities in life science.

physics.bio-ph↗

arXiv2021

Material-specific high-resolution table-top extreme ultraviolet microscopy

Microscopy with extreme ultraviolet (EUV) radiation holds promise for high-resolution imaging with excellent material contrast, due to the short wavelength and numerous element-specific absorption edges available in this spectral range. At the same time, EUV radiation has significantly larger penetration depths than electrons. It thus enables a nano-scale view into complex three-dimensional structures that are important for material science, semiconductor metrology, and next-generation nano-devices. Here, we present high-resolution and material-specific microscopy at 13.5 nm wavelength. We combine a highly stable, high photon-flux, table-top EUV source with an interferometrically stabilized ptychography setup. By utilizing structured EUV illumination, we overcome the limitations of conventional EUV focusing optics and demonstrate high-resolution microscopy at a half-pitch lateral resolution of 16 nm. Moreover, we propose mixed-state orthogonal probe relaxation ptychography, enabling robust phase-contrast imaging over wide fields of view and long acquisition times. In this way, the complex transmission of an integrated circuit is precisely reconstructed, allowing for the classification of the material composition of mesoscopic semiconductor systems.

physics.optics↗

arXiv2021

Real-time phase-retrieval and wavefront sensing enabled by an artificial neural network

In this manuscript we demonstrate a method to reconstruct the wavefront of focused beams from a measured diffraction pattern behind a diffracting mask in real-time. The phase problem is solved by means of a neural network, which is trained with simulated data and verified with experimental data. The neural network allows live reconstructions within a few milliseconds, which previously with iterative phase retrieval took several seconds, thus allowing the adjustment of complex systems and correction by adaptive optics in real time. The neural network additionally outperforms iterative phase retrieval with high noise diffraction patterns.

eess.IV↗

arXiv2020

Broadband holography-assisted coherent imaging -- towards attosecond imaging at the nanoscale

In recent years nanoscale coherent imaging has emerged as an indispensable imaging modality allowing to surpass the resolution limit given by classical imaging optics. At the same time, attosecond science has experienced enormous progress and has revealed the ultrafast dynamics in atoms, molecules, and complex materials. Combining attosecond temporal resolution of pump-probe experiments with nanometer spatial resolution would allow studying ultrafast dynamics on the smallest spatio-temporal scales but has not been demonstrated yet. Unfortunately, the large bandwidth of attosecond pulses usually hinders high-resolution coherent imaging. Here we present a robust holography-enhanced coherent imaging method, which allows combining high quality and high spatial resolution coherent imaging with a large spectral bandwidth. By implementing our method at a high harmonic source we demonstrate, for the first time, a spatial resolution of 34 nm (2.5 λ) in combination with a spectral bandwidth supporting a Fourier limited pulse duration of only 380 as. The method is single-shot capable, additionally retrieves the spectrum from the measured diffraction pattern, and is thus immune against shot-to-shot fluctuations. This paves the way for an ultrafast view on nanoscale dynamics e.g. ultrafast charge transfer or ultrafast spin currents being relevant for Petahertz electronics and future data storage.

physics.optics↗

arXiv2018

Wavelength-scale ptychographic coherent diffractive imaging using a high-order harmonic source

Ptychography enables coherent diffractive imaging (CDI) of extended samples by raster scanning across the illuminating XUV/X-ray beam thereby generalizing the unique advantages of CDI techniques. Table-top realizations of this method are urgently needed for many applications in sciences and industry. Previously, it was only possible to image features much larger than the illuminating wavelength with table-top ptychography although knife-edge tests suggested sub-wavelength resolution. However, most real-world imaging applications require resolving of the smallest and closely-spaced features of a sample in an extended field of view. In this work, we resolve features as small as 2.5 λ(45 nm) by using a table-top ptychography setup and a high-order harmonic XUV source. For the first time, a Rayleigh-type criterion is used as a direct and unambiguous resolution metric for high-resolution table-top setup. This reliably qualifies this imaging system for real-world applications e.g. in biological sciences, material sciences, imaging integrated circuits and semiconductor mask inspection.

physics.optics↗