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William Wahby

Publications and source records attributed to William Wahby.

2 recordsLinked to original sources

A self-heating electrochemical cell with nine decades of programmable linear resistance

A programmable linear resistor with a compact footprint would have profound implications for microelectronics, enabling efficient in-sensor analog signal processing and in-memory computing. Non-volatile memory offers a potential solution but suffers from limitations due to the programming mechanisms that confine switching to nanoscale constrictions or field-sensitive semiconductor junctions, leading to non-linear current-voltage relationships and errors. Here, we introduce a tunable resistor that is programmed into non-volatile, high-precision resistance states spanning nine orders of magnitude, with linear current-voltage characteristics across the entire range -- significantly improving the performance and widening the application space of resistive memory. A key advance is an electrothermal gate that simultaneously spreads heat and electrochemical reactions during programming to enable large, bulk composition modulation. The volumetric modulation can host thousands of linear resistance states with 100x lower conductance errors than other memory. This enables direct processing of analog signals with high fidelity, and we demonstrate variable-gain amplification, division, and multiplication. Integration with CMOS is used to show resilience to electrical and thermal disturb in arrays and to demonstrate retention of analog levels at <1% average loss for more than 2 months across 100 devices. Simulations indicate matrix multiplication efficiency could approach >1,000 TOPS/W.

cs.ET

Strong radial electric field scaling near nanoscale conductive filaments and the ReRAM resistive switching mechanism

The physics underlying reset in bipolar resistive memory has been the subject of decades of controversy and has been identified as the primary barrier to resistive memory technology development. This manuscript introduces a nanoscale effect in current carrying conductors, whereby surface charge induced radial electric fields are found to be inversely proportional to the radius of the conductive path. This nanoscale effect is then applied to explain the negative resistance switching (reset) mechanism in filamentary metal oxide resistive switching memory devices (memristors). Previous explanations for the negative resistive switching mechanism state that diffusion constitutes the radial driving mechanism for oxygen ions, and drift under electric fields is restricted to the direction parallel to current flow. This explanation conflicts with retention and microscopy data collected in a subset of devices presented in literature. We demonstrate that the electric field's dependency on the on the radius of a nanoscale conductive path can result in radial fields on the order of 10^5 to 10^6 V/cm at only -1 V bias, sufficient to govern the negative resistance switching mechanism in filamentary metal oxides. By accounting for this nanoscale size effect, long standing anomalous experimental data about the negative (reset) resistance switching mechanism in bipolar filamentary resistive memory devices is finally reconciled. Wide understanding of surface charges and associated electric fields in nanoscale conductive paths could prove important for further scaling of integrated circuits and aid in elucidating many nanoscale phenomena.

cond-mat.mes-hall