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Xiaohui Wan

Publications and source records attributed to Xiaohui Wan.

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ARFT-Transformer: Modeling Metric Dependencies for Cross-Project Aging-Related Bug Prediction

Software systems that run for long periods often suffer from software aging, which is typically caused by Aging-Related Bugs (ARBs). To mitigate the risk of ARBs early in the development phase, ARB prediction has been introduced into software aging research. However, due to the difficulty of collecting ARBs, within-project ARB prediction faces the challenge of data scarcity, leading to the proposal of cross-project ARB prediction. This task faces two major challenges: 1) domain adaptation issue caused by distribution difference between source and target projects; and 2) severe class imbalance between ARB-prone and ARB-free samples. Although various methods have been proposed for cross-project ARB prediction, existing approaches treat the input metrics independently and often neglect the rich inter-metric dependencies, which can lead to overlapping information and misjudgment of metric importance, potentially affecting the model's performance. Moreover, they typically use cross-entropy as the loss function during training, which cannot distinguish the difficulty of sample classification. To overcome these limitations, we propose ARFT-Transformer, a transformer-based cross-project ARB prediction framework that introduces a metric-level multi-head attention mechanism to capture metric interactions and incorporates Focal Loss function to effectively handle class imbalance. Experiments conducted on three large-scale open-source projects demonstrate that ARFT-Transformer on average outperforms state-of-the-art cross-project ARB prediction methods in both single-source and multi-source cases, achieving up to a 29.54% and 19.92% improvement in Balance metric.

cs.SE

Data Complexity: A New Perspective for Analyzing the Difficulty of Defect Prediction Tasks

Defect prediction is crucial for software quality assurance and has been extensively researched over recent decades. However, prior studies rarely focus on data complexity in defect prediction tasks, and even less on understanding the difficulties of these tasks from the perspective of data complexity. In this paper, we conduct an empirical study to estimate the hardness of over 33,000 instances, employing a set of measures to characterize the inherent difficulty of instances and the characteristics of defect datasets. Our findings indicate that: (1) instance hardness in both classes displays a right-skewed distribution, with the defective class exhibiting a more scattered distribution; (2) class overlap is the primary factor influencing instance hardness and can be characterized through feature, structural, instance, and multiresolution overlap; (3) no universal preprocessing technique is applicable to all datasets, and it may not consistently reduce data complexity, fortunately, dataset complexity measures can help identify suitable techniques for specific datasets; (4) integrating data complexity information into the learning process can enhance an algorithm's learning capacity. In summary, this empirical study highlights the crucial role of data complexity in defect prediction tasks, and provides a novel perspective for advancing research in defect prediction techniques.

cs.SE