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Y. Sonnefraud

Publications and source records attributed to Y. Sonnefraud.

8 recordsLinked to original sources

Experimental verification of entanglement generated in a plasmonic system

A core process in many quantum tasks is the generation of entanglement. It is being actively studied in a variety of physical settings - from simple bipartite systems to complex multipartite systems. In this work we experimentally study the generation of bipartite entanglement in a nanophotonic system. Entanglement is generated via the quantum interference of two surface plasmon polaritons in a beamsplitter structure, i.e. utilising the Hong-Ou-Mandel (HOM) effect, and its presence is verified using quantum state tomography. The amount of entanglement is quantified by the concurrence and we find values of up to 0.77 +/- 0.04. Verifying entanglement in the output state from HOM interference is a nontrivial task and cannot be inferred from the visibility alone. The techniques we use to verify entanglement could be applied to other types of photonic system and therefore may be useful for the characterisation of a range of different nanophotonic quantum devices.

quant-ph

Near-field microscopy with a scanning nitrogen-vacancy color center in a diamond nanocrystal: A brief review

We review our recent developments of near-field scanning optical microscopy (NSOM) that uses an active tip made of a single fluorescent nanodiamond (ND) grafted onto the apex of a substrate fiber tip. The ND hosting a limited number of nitrogen-vacancy (NV) color centers, such a tip is a scanning quantum source of light. The method for preparing the ND-based tips and their basic properties are summarized. Then we discuss theoretically the concept of spatial resolution that is achievable in this special NSOM configuration and find it to be only limited by the scan height over the imaged system, in contrast with the standard aperture-tip NSOM whose resolution depends critically on both the scan height and aperture diameter. Finally, we describe a scheme we have introduced recently for high-resolution imaging of nanoplasmonic structures with ND-based tips that is capable of approaching the ultimate resolution anticipated by theory.

physics.optics

Attosecond streaking of photoelectron emission from disordered solids

Attosecond streaking of photoelectrons emitted by extreme ultraviolet light has begun to reveal how electrons behave during their transport within simple crystalline solids. Many sample types within nanoplasmonics, thin-film physics, and semiconductor physics, however, do not have a simple single crystal structure. The electron dynamics which underpin the optical response of plasmonic nanostructures and wide-bandgap semiconductors happen on an attosecond timescale. Measuring these dynamics using attosecond streaking will enable such systems to be specially tailored for applications in areas such as ultrafast opto-electronics. We show that streaking can be extended to this very general type of sample by presenting streaking measurements on an amorphous film of the wide-bandgap semiconductor tungsten trioxide, and on polycrystalline gold, a material that forms the basis of many nanoplasmonic devices. Our measurements reveal the near-field temporal structure at the sample surface, and photoelectron wavepacket temporal broadening consistent with a spread of electron transport times to the surface.

physics.optics

Observation of quantum interference in the plasmonic Hong-Ou-Mandel effect

We report direct evidence of the bosonic nature of surface plasmon polaritons (SPPs) in a scattering-based beamsplitter. A parametric down-conversion source is used to produce two indistinguishable photons, each of which is converted into a SPP on a metal-stripe waveguide and then made to interact through a semi-transparent Bragg mirror. In this plasmonic analog of the Hong-Ou-Mandel experiment, we measure a coincidence dip with a visibility of 72%, a key signature that SPPs are bosons and that quantum interference is clearly involved.

quant-ph

Near-field optical imaging with a CdSe single nanocrystal-based active tip

We report near-field scanning optical imaging with an active tip made of a single fluorescent CdSe nanocrystal attached at the apex of an optical tip. Although the images are acquired only partially because of the random blinking of the semiconductor particle, our work validates the use of such tips in ultra-high spatial resolution optical microscopy.

physics.optics

Near-field optical microscopy with a nanodiamond-based single photon tip

We introduce a point-like scanning single-photon source that operates at room temperature and offers an exceptional photostability (no blinking, no bleaching). This is obtained by grafting in a controlled way a diamond nanocrystal (size around 20 nm) with single nitrogen-vacancy color-center occupancy at the apex of an optical probe. As an application, we image metallic nanostructures in the near-field, thereby achieving a near-field scanning single-photon microscopy working at room temperature on the long term. Our work may be of importance to various emerging fields of nanoscience where an accurate positioning of a quantum emitter is required such as for example quantum plasmonics.

physics.optics

Fluorescent oxide nanoparticles adapted to active tips for near-field optics

We present a new kind of fluorescent oxide nanoparticles with properties well suited to active-tip based near-field optics. These particles with an average diameter in the range 5-10 nm are produced by Low Energy Cluster Beam Deposition (LECBD) from a YAG:Ce3+ target. They are studied by transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), classical photoluminescence, cathodoluminescence and near-field scanning optical microscopy (NSOM). Particles of extreme photo-stability as small as 10 nm in size are observed. These emitters are validated as building blocks of active NSOM tips by coating a standard optical tip with a 10 nm thick layer of YAG:Ce3+ particles directly in the LECBD reactor and by subsequently performing NSOM imaging of test surfaces.

cond-mat.mtrl-sci