arXiv subjects

Y. Yokoyama

Publications and source records attributed to Y. Yokoyama.

6 recordsLinked to original sources

arXiv2019

Study of photoinduced valence dynamics in EuNi$_2$(Si$_{0.21}$Ge$_{0.79}$)$_2$ through time-resolved X-ray absorption spectroscopy

The photoinduced valence dynamics of EuNi$_2$(Si$_{0.21}$Ge$_{0.79}$)$_2$ are investigated using time-resolved X-ray absorption spectroscopy for Eu $M_5$-edge. Through the pump-probe technique with synchrotron X-ray and Ti:sapphire laser pulse, a photoinduced valence transition is observed from Eu$^{3+}$ to Eu$^{2+}$. Because the lifetime of a photoinduced state can be up to 3 ns, a metastable state is considered to be realized. By comparing the experimental results with the theoretical calculations, the photoinduced valence transition between Eu 4$f$ and conduction electrons is quantitatively evaluated.

cond-mat.mtrl-sci↗

arXiv2018

Electronic Structure of Ce-Doped and -Undoped Nd$_2$CuO$_4$ Superconducting Thin Films Studied by Hard X-ray Photoemission and Soft X-ray Absorption Spectroscopy

In order to realize superconductivity in cuprates with the T'-type structure, not only chemical substitution (Ce doping) but also post-growth reduction annealing is necessary. In the case of thin films, however, well-designed reduction annealing alone without Ce doping can induce superconductivity in the T'-type cuprates. In order to unveil the origin of superconductivity in the Ce-undoped T'-type cuprates, we have performed bulk-sensitive hard x-ray photoemission and soft x-ray absorption spectroscopies on superconducting and non-superconducting Nd$_{2-x}$Ce$_x$CuO$_4$ ($x=$ 0, 0.15, and 0.19) thin films. By post-growth annealing, core-level spectra exhibited dramatic changes, which we attributed to the enhancement of core-hole screening in the CuO$_2$ plane and the shift of chemical potential along with changes in the band filling. The result suggests that the superconducting Nd$_2$CuO$_4$ film is doped with electrons and that the electronic states are similar to those of Ce-doped superconductors.

cond-mat.supr-con↗

arXiv2017

Tensile-Strain Dependent Spin States in Epitaxial LaCoO$_3$ Thin Films

The spin states of Co$^{3+}$ ions in perovskite-type LaCoO$_3$, governed by complex interplay between the electron-lattice interactions and the strong electron correlations, still remain controversial due to the lack of experimental techniques which can detect directly. In this letter, we revealed the tensile-strain dependence of spin states, $i. e.$ the ratio of the high- and low-spin states, in epitaxial thin films and a bulk crystal of LaCoO$_3$ via resonant inelastic soft x-ray scattering. The tensile-strain as small as 1.0% was found to realize different spin states from that in the bulk.

cond-mat.str-el↗

arXiv2015

Electronic structure of Li$_{1+x}$[Mn$_{0.5}$Ni$_{0.5}$]$_{1-x}$O$_2$ studied by photoemission and x-ray absorption spectroscopy

We have studied the electronic structure of Li$_{1+x}$[Mn$_{0.5}$Ni$_{0.5}$]$_{1-x}$O$_2$ ($x$ = 0.00 and 0.05), one of the promising cathode materials for Li ion battery, by means of x-ray photoemission and absorption spectroscopy. The results show that the valences of Mn and Ni are basically 4+ and 2+, respectively. However, the Mn$^{3+}$ component in the $x$ = 0.00 sample gradually increases with the bulk sensitivity of the experiment, indicating that the Jahn-Teller active Mn$^{3+}$ ions are introduced in the bulk due to the site exchange between Li and Ni. The Mn$^{3+}$ component gets negligibly small in the $x$ = 0.05 sample, which indicates that the excess Li suppresses the site exchange and removes the Jahn-Teller active Mn$^{3+}$.

cond-mat.str-el↗

arXiv2014

A method for measuring the contact area in instrumented indentation testing by tip scanning probe microscopy imaging

The determination of the contact area is a key step to derive mechanical properties such as hardness or an elastic modulus by instrumented indentation testing. Two families of procedures are dedicated to extracting this area: on the one hand, post mortem measurements that require residual imprint imaging, and on the other hand, direct methods that only rely on the load vs. the penetration depth curve. With the development of built-in scanning probe microscopy imaging capabilities such as atomic force microscopy and indentation tip scanning probe microscopy, last generation indentation devices have made systematic residual imprint imaging much faster and more reliable. In this paper, a new post mortem method is introduced and further compared to three existing classical direct methods by means of a numerical and experimental benchmark covering a large range of materials. It is shown that the new method systematically leads to lower error levels regardless of the type of material. Pros and cons of the new method vs. direct methods are also discussed, demonstrating its efficiency in easily extracting mechanical properties with an enhanced confidence.

cond-mat.mtrl-sci↗

arXiv2006

Monte-Carlo Simulator and Ancillary Response Generator of Suzaku XRT/XIS System for Spatially Extended Source Analysis

We have developed a framework for the Monte-Carlo simulation of the X-Ray Telescopes (XRT) and the X-ray Imaging Spectrometers (XIS) onboard Suzaku, mainly for the scientific analysis of spatially and spectroscopically complex celestial sources. A photon-by-photon instrumental simulator is built on the ANL platform, which has been successfully used in ASCA data analysis. The simulator has a modular structure, in which the XRT simulation is based on a ray-tracing library, while the XIS simulation utilizes a spectral "Redistribution Matrix File" (RMF), generated separately by other tools. Instrumental characteristics and calibration results, e.g., XRT geometry, reflectivity, mutual alignments, thermal shield transmission, build-up of the contamination on the XIS optical blocking filters (OBF), are incorporated as completely as possible. Most of this information is available in the form of the FITS (Flexible Image Transport System) files in the standard calibration database (CALDB). This simulator can also be utilized to generate an "Ancillary Response File" (ARF), which describes the XRT response and the amount of OBF contamination. The ARF is dependent on the spatial distribution of the celestial target and the photon accumulation region on the detector, as well as observing conditions such as the observation date and satellite attitude. We describe principles of the simulator and the ARF generator, and demonstrate their performance in comparison with in-flight data.

astro-ph↗