arXiv subjects

Yahya Can Tuğrul

Publications and source records attributed to Yahya Can Tuğrul.

9 recordsLinked to original sources

arXiv2025

DRAM Bender: An Extensible and Versatile FPGA-based Infrastructure to Easily Test State-of-the-art DRAM Chips

To understand and improve DRAM performance, reliability, security and energy efficiency, prior works study characteristics of commodity DRAM chips. Unfortunately, state-of-the-art open source infrastructures capable of conducting such studies are obsolete, poorly supported, or difficult to use, or their inflexibility limit the types of studies they can conduct. We propose DRAM Bender, a new FPGA-based infrastructure that enables experimental studies on state-of-the-art DRAM chips. DRAM Bender offers three key features at the same time. First, DRAM Bender enables directly interfacing with a DRAM chip through its low-level interface. This allows users to issue DRAM commands in arbitrary order and with finer-grained time intervals compared to other open source infrastructures. Second, DRAM Bender exposes easy-to-use C++ and Python programming interfaces, allowing users to quickly and easily develop different types of DRAM experiments. Third, DRAM Bender is easily extensible. The modular design of DRAM Bender allows extending it to (i) support existing and emerging DRAM interfaces, and (ii) run on new commercial or custom FPGA boards with little effort. To demonstrate that DRAM Bender is a versatile infrastructure, we conduct three case studies, two of which lead to new observations about the DRAM RowHammer vulnerability. In particular, we show that data patterns supported by DRAM Bender uncovers a larger set of bit-flips on a victim row compared to the data patterns commonly used by prior work. We demonstrate the extensibility of DRAM Bender by implementing it on five different FPGAs with DDR4 and DDR3 support. DRAM Bender is freely and openly available at https://github.com/CMU-SAFARI/DRAM-Bender.

cs.AR↗

arXiv2025

Understanding RowHammer Under Reduced Refresh Latency: Experimental Analysis of Real DRAM Chips and Implications on Future Solutions

RowHammer is a major read disturbance mechanism in DRAM where repeatedly accessing (hammering) a row of DRAM cells (DRAM row) induces bitflips in physically nearby DRAM rows (victim rows). To ensure robust DRAM operation, state-of-the-art mitigation mechanisms restore the charge in potential victim rows (i.e., they perform preventive refresh or charge restoration). With newer DRAM chip generations, these mechanisms perform preventive refresh more aggressively and cause larger performance, energy, or area overheads. Therefore, it is essential to develop a better understanding and in-depth insights into the preventive refresh to secure real DRAM chips at low cost. In this paper, our goal is to mitigate RowHammer at low cost by understanding the impact of reduced preventive refresh latency on RowHammer. To this end, we present the first rigorous experimental study on the interactions between refresh latency and RowHammer characteristics in real DRAM chips. Our experimental characterization using 388 real DDR4 DRAM chips from three major manufacturers demonstrates that a preventive refresh latency can be significantly reduced (by 64%). To investigate the impact of reduced preventive refresh latency on system performance and energy efficiency, we reduce the preventive refresh latency and adjust the aggressiveness of existing RowHammer solutions by developing a new mechanism, Partial Charge Restoration for Aggressive Mitigation (PaCRAM). Our results show that PaCRAM reduces the performance and energy overheads induced by five state-of-the-art RowHammer mitigation mechanisms with small additional area overhead. Thus, PaCRAM introduces a novel perspective into addressing RowHammer vulnerability at low cost by leveraging our experimental observations. To aid future research, we open-source our PaCRAM implementation at https://github.com/CMU-SAFARI/PaCRAM.

cs.AR↗

arXiv2024

BreakHammer: Enhancing RowHammer Mitigations by Carefully Throttling Suspect Threads

RowHammer is a major read disturbance mechanism in DRAM where repeatedly accessing (hammering) a row of DRAM cells (DRAM row) induces bitflips in other physically nearby DRAM rows. RowHammer solutions perform preventive actions (e.g., refresh neighbor rows of the hammered row) that mitigate such bitflips to preserve memory isolation, a fundamental building block of security and privacy in modern computing systems. However, preventive actions induce non-negligible memory request latency and system performance overheads as they interfere with memory requests. As shrinking technology node size over DRAM chip generations exacerbates RowHammer, the overheads of RowHammer solutions become prohibitively expensive. As a result, a malicious program can effectively hog the memory system and deny service to benign applications by causing many RowHammer-preventive actions. In this work, we tackle the performance overheads of RowHammer solutions by tracking and throttling the generators of memory accesses that trigger RowHammer solutions. To this end, we propose BreakHammer. BreakHammer 1) observes the time-consuming RowHammer-preventive actions of existing RowHammer mitigation mechanisms, 2) identifies hardware threads that trigger many of these actions, and 3) reduces the memory bandwidth usage of each identified thread. As such, BreakHammer significantly reduces the number of RowHammer-preventive actions performed, thereby improving 1) system performance and DRAM energy, and 2) reducing the maximum slowdown induced on a benign application, with near-zero area overhead. Our extensive evaluations demonstrate that BreakHammer effectively reduces the negative performance, energy, and fairness effects of eight RowHammer mitigation mechanisms. To foster further research we open-source our BreakHammer implementation and scripts at https://github.com/CMU-SAFARI/BreakHammer.

cs.CR↗

arXiv2024

RowPress Vulnerability in Modern DRAM Chips

Memory isolation is a critical property for system reliability, security, and safety. We demonstrate RowPress, a DRAM read disturbance phenomenon different from the well-known RowHammer. RowPress induces bitflips by keeping a DRAM row open for a long period of time instead of repeatedly opening and closing the row. We experimentally characterize RowPress bitflips, showing their widespread existence in commodity off-the-shelf DDR4 DRAM chips. We demonstrate RowPress bitflips in a real system that already has RowHammer protection, and propose effective mitigation techniques that protect DRAM against both RowHammer and RowPress.

cs.AR↗

arXiv2024

RowPress: Amplifying Read Disturbance in Modern DRAM Chips

Memory isolation is critical for system reliability, security, and safety. Unfortunately, read disturbance can break memory isolation in modern DRAM chips. For example, RowHammer is a well-studied read-disturb phenomenon where repeatedly opening and closing (i.e., hammering) a DRAM row many times causes bitflips in physically nearby rows. This paper experimentally demonstrates and analyzes another widespread read-disturb phenomenon, RowPress, in real DDR4 DRAM chips. RowPress breaks memory isolation by keeping a DRAM row open for a long period of time, which disturbs physically nearby rows enough to cause bitflips. We show that RowPress amplifies DRAM's vulnerability to read-disturb attacks by significantly reducing the number of row activations needed to induce a bitflip by one to two orders of magnitude under realistic conditions. In extreme cases, RowPress induces bitflips in a DRAM row when an adjacent row is activated only once. Our detailed characterization of 164 real DDR4 DRAM chips shows that RowPress 1) affects chips from all three major DRAM manufacturers, 2) gets worse as DRAM technology scales down to smaller node sizes, and 3) affects a different set of DRAM cells from RowHammer and behaves differently from RowHammer as temperature and access pattern changes. We demonstrate in a real DDR4-based system with RowHammer protection that 1) a user-level program induces bitflips by leveraging RowPress while conventional RowHammer cannot do so, and 2) a memory controller that adaptively keeps the DRAM row open for a longer period of time based on access pattern can facilitate RowPress-based attacks. To prevent bitflips due to RowPress, we describe and evaluate a new methodology that adapts existing RowHammer mitigation techniques to also mitigate RowPress with low additional performance overhead. We open source all our code and data to facilitate future research on RowPress.

cs.CR↗

arXiv2024

Spatial Variation-Aware Read Disturbance Defenses: Experimental Analysis of Real DRAM Chips and Implications on Future Solutions

Read disturbance in modern DRAM chips is a widespread phenomenon and is reliably used for breaking memory isolation, a fundamental building block for building robust systems. RowHammer and RowPress are two examples of read disturbance in DRAM where repeatedly accessing (hammering) or keeping active (pressing) a memory location induces bitflips in other memory locations. Unfortunately, shrinking technology node size exacerbates read disturbance in DRAM chips over generations. As a result, existing defense mechanisms suffer from significant performance and energy overheads, limited effectiveness, or prohibitively high hardware complexity. In this paper, we tackle these shortcomings by leveraging the spatial variation in read disturbance across different memory locations in real DRAM chips. To do so, we 1) present the first rigorous real DRAM chip characterization study of spatial variation of read disturbance and 2) propose Svärd, a new mechanism that dynamically adapts the aggressiveness of existing solutions based on the row-level read disturbance profile. Our experimental characterization on 144 real DDR4 DRAM chips representing 10 chip designs demonstrates a large variation in read disturbance vulnerability across different memory locations: in the part of memory with the worst read disturbance vulnerability, 1) up to 2x the number of bitflips can occur and 2) bitflips can occur at an order of magnitude fewer accesses, compared to the memory locations with the least vulnerability to read disturbance. Svärd leverages this variation to reduce the overheads of five state-of-the-art read disturbance solutions, and thus significantly increases system performance.

cs.CR↗

arXiv2023

Ramulator 2.0: A Modern, Modular, and Extensible DRAM Simulator

We present Ramulator 2.0, a highly modular and extensible DRAM simulator that enables rapid and agile implementation and evaluation of design changes in the memory controller and DRAM to meet the increasing research effort in improving the performance, security, and reliability of memory systems. Ramulator 2.0 abstracts and models key components in a DRAM-based memory system and their interactions into shared interfaces and independent implementations. Doing so enables easy modification and extension of the modeled functions of the memory controller and DRAM in Ramulator 2.0. The DRAM specification syntax of Ramulator 2.0 is concise and human-readable, facilitating easy modifications and extensions. Ramulator 2.0 implements a library of reusable templated lambda functions to model the functionalities of DRAM commands to simplify the implementation of new DRAM standards, including DDR5, LPDDR5, HBM3, and GDDR6. We showcase Ramulator 2.0's modularity and extensibility by implementing and evaluating a wide variety of RowHammer mitigation techniques that require different memory controller design changes. These techniques are added modularly as separate implementations without changing any code in the baseline memory controller implementation. Ramulator 2.0 is rigorously validated and maintains a fast simulation speed compared to existing cycle-accurate DRAM simulators. Ramulator 2.0 is open-sourced under the permissive MIT license at https://github.com/CMU-SAFARI/ramulator2

cs.AR↗

arXiv2023

An Experimental Analysis of RowHammer in HBM2 DRAM Chips

RowHammer (RH) is a significant and worsening security, safety, and reliability issue of modern DRAM chips that can be exploited to break memory isolation. Therefore, it is important to understand real DRAM chips' RH characteristics. Unfortunately, no prior work extensively studies the RH vulnerability of modern 3D-stacked high-bandwidth memory (HBM) chips, which are commonly used in modern GPUs. In this work, we experimentally characterize the RH vulnerability of a real HBM2 DRAM chip. We show that 1) different 3D-stacked channels of HBM2 memory exhibit significantly different levels of RH vulnerability (up to 79% difference in bit error rate), 2) the DRAM rows at the end of a DRAM bank (rows with the highest addresses) exhibit significantly fewer RH bitflips than other rows, and 3) a modern HBM2 DRAM chip implements undisclosed RH defenses that are triggered by periodic refresh operations. We describe the implications of our observations on future RH attacks and defenses and discuss future work for understanding RH in 3D-stacked memories.

cs.CR↗

arXiv2022

TuRaN: True Random Number Generation Using Supply Voltage Underscaling in SRAMs

Prior works propose SRAM-based TRNGs that extract entropy from SRAM arrays. SRAM arrays are widely used in a majority of specialized or general-purpose chips that perform the computation to store data inside the chip. Thus, SRAM-based TRNGs present a low-cost alternative to dedicated hardware TRNGs. However, existing SRAM-based TRNGs suffer from 1) low TRNG throughput, 2) high energy consumption, 3) high TRNG latency, and 4) the inability to generate true random numbers continuously, which limits the application space of SRAM-based TRNGs. Our goal in this paper is to design an SRAM-based TRNG that overcomes these four key limitations and thus, extends the application space of SRAM-based TRNGs. To this end, we propose TuRaN, a new high-throughput, energy-efficient, and low-latency SRAM-based TRNG that can sustain continuous operation. TuRaN leverages the key observation that accessing SRAM cells results in random access failures when the supply voltage is reduced below the manufacturer-recommended supply voltage. TuRaN generates random numbers at high throughput by repeatedly accessing SRAM cells with reduced supply voltage and post-processing the resulting random faults using the SHA-256 hash function. To demonstrate the feasibility of TuRaN, we conduct SPICE simulations on different process nodes and analyze the potential of access failure for use as an entropy source. We verify and support our simulation results by conducting real-world experiments on two commercial off-the-shelf FPGA boards. We evaluate the quality of the random numbers generated by TuRaN using the widely-adopted NIST standard randomness tests and observe that TuRaN passes all tests. TuRaN generates true random numbers with (i) an average (maximum) throughput of 1.6Gbps (1.812Gbps), (ii) 0.11nJ/bit energy consumption, and (iii) 278.46us latency.

cs.AR↗