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Yanling Ge

Publications and source records attributed to Yanling Ge.

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Nanoscale structure formation in nickel-aluminum alloys synthesized far from equilibrium

The present study reports on the structure formation in thin epitaxial nickel-aluminum films (Ni1-xAlx; Al atomic fraction x up to x=0.24) grown on MgO(001) substrates by magnetron sputtering. Experimental and computational data demonstrate that for x<0.11, the films exhibit the face-centered cubic random solid-solution Ni1-xAlx structure ({\gamma}). Whereas in the range x=0.11-0.24 the phase coexists with the ordered L12 structure ({\gamma}' phase). The two phases are homogenously intermixed forming a coherent and strained nano-solution, which exhibits a single lattice parameter that expands as the Al content increases. Isothermal annealing of films containing x=0.14 of Al, coupled with structural and nano-mechanical characterization, reveal that the nano-solution retains its overall integrity for temperatures up to 673 K, while the film hardness increases from 5.5 GPa (as deposited films) to 6 GPa. Further increase of the annealing temperature to 873 K and 1073 K causes the nano-solution to dissolve into distinct {\gamma} and {\gamma}' phase domains and the hardness to decrease down to values of 4 GPa. These findings confirm the metastable nature of the as-deposited thin Ni1-xAlx alloy films and underpin the effectiveness of high supersaturation/undercooling for creating non-equilibrium phases and self-organized nanostructures upon synthesis of multicomponent materials.

cond-mat.mtrl-sci

Silica-Silicon Composites for Near-Infrared Reflection: A Comprehensive Computational and Experimental Study

Compact layers containing embedded semiconductor particles consolidated using pulsed electric current sintering exhibit intense, broadband near-infrared reflectance. The composites consolidated from nano- or micro-silica powder have a different porous microstructure which causes scattering at the air-matrix interface and larger reflectance primarily in the visible region. The 3 mm thick composite compacts reflect up to 72% of the incident radiation in the near-infrared region with a semiconductor microinclusion volume fraction of 1% which closely matches predictions from multiscale Monte Carlo modeling and Kubelka-Munk theory. Further, the calculated spectra predict an improvement of the reflectance by decreasing the average particle size or broadening the standard deviation. The high reflectance is achieved with minimal dissipative losses and facile manufacturing, and the composites described herein are well-suited to control the radiative transfer of heat in devices at high temperature and under harsh conditions.

physics.app-ph