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Yi-Chieh Yang

Publications and source records attributed to Yi-Chieh Yang.

2 recordsLinked to original sources

Thermal and Size Effects in Ferroelastic Domains by Machine Learning

Ferroelastic domain walls (DWs) underpin key functionalities in complex oxides. In free-standing ferroic thin films, where elastic interactions are highly thickness dependent, understanding DW behaviour across length scales and external stimuli is crucial. A thickness-dependent monopolar-to-dipolar crossover in elastic DW behaviour has been reported; however, how temperature influences this regime remains unexplored. Here, LaAlO3 thin films spanning the dipolar ($<200$ nm) and crossover (200-300 nm) regimes are investigated using in situ heating scanning transmission electron microscopy (STEM) and a machine-learning-driven image analysis approach. By tracking DW curvature and density from above $T_C$ (approximately $550,^\circ$C) to room temperature (RT), a distinct interplay between temperature and thickness is identified. In the dipolar regime, DWs are mobile and curved near $T_C$ and gradually freeze upon cooling, consistent with the well-known temperature freezing regime. In contrast, within the crossover regime, DWs are nearly static, with minimal reconfiguration through cooling and curvature an order of magnitude lower at RT. These results map the evolution of DWs across the thermally driven super-elastic to freezing regimes, revealing how thickness and temperature govern DW morphology and dynamics, and providing insight relevant for domain engineering in free-standing oxide thin films.

cond-mat.mtrl-sci

Improving the Accuracy of Temperature Measurement on TEM samples using Plasmon Energy Expansion Thermometry (PEET): Addressing Sample Thickness Effects

Advances in analytical scanning transmission electron microscopy (STEM) and microelectronic mechanical systems (MEMS) based microheaters have enabled in-situ materials characterization at the nanometer scale at elevated temperature. In addition to resolving the structural information at elevated temperatures, detailed knowledge of the local temperature distribution inside the sample is essential to reveal thermally induced phenomena and processes. Here, we investigate the accuracy of plasmon energy expansion thermometry (PEET) as a method to map the local temperature in a tungsten (W) lamella in a range between room temperature and 700 degC. In particular, we address the influence of sample thickness in the range of a typical electron-transparent TEM sample (from 30 nm to 70 nm) on the temperature-dependent plasmon energy. The shift in plasmon energy, used to determine the local sample temperature, is not only temperature-dependent, but in case of W also thickness-dependent in sample thicknesses below approximately 60 nm. The results highlight the importance of considering sample thickness (and especially thickness variations) when analyzing the local bulk plasmon energy for temperature measurement using PEET. However, in case of W, an increasing beam broadening (FWHM) of the bulk plasmon peak with decreasing sample thickness can be used to improve the accuracy of PEET in TEM lamellae with varying sample thickness.

cond-mat.mtrl-sci