arXiv subjects

Yingshui Tan

Publications and source records attributed to Yingshui Tan.

39 records · Page 3Linked to original sources

arXiv2020

Are Ensemble Classifiers Powerful Enough for the Detection and Diagnosis of Intermediate-Severity Faults?

Intermediate-Severity (IS) faults present milder symptoms compared to severe faults, and are more difficult to detect and diagnose due to their close resemblance to normal operating conditions. The lack of IS fault examples in the training data can pose severe risks to Fault Detection and Diagnosis (FDD) methods that are built upon Machine Learning (ML) techniques, because these faults can be easily mistaken as normal operating conditions. Ensemble models are widely applied in ML and are considered promising methods for detecting out-of-distribution (OOD) data. We identify common pitfalls in these models through extensive experiments with several popular ensemble models on two real-world datasets. Then, we discuss how to design more effective ensemble models for detecting and diagnosing IS faults.

cs.LG↗

arXiv2019

Augmenting Monte Carlo Dropout Classification Models with Unsupervised Learning Tasks for Detecting and Diagnosing Out-of-Distribution Faults

The Monte Carlo dropout method has proved to be a scalable and easy-to-use approach for estimating the uncertainty of deep neural network predictions. This approach was recently applied to Fault Detection and Di-agnosis (FDD) applications to improve the classification performance on incipient faults. In this paper, we propose a novel approach of augmenting the classification model with an additional unsupervised learning task. We justify our choice of algorithm design via an information-theoretical analysis. Our experimental results on three datasets from diverse application domains show that the proposed method leads to improved fault detection and diagnosis performance, especially on out-of-distribution examples including both incipient and unknown faults.

cs.LG↗

arXiv2019

An Encoder-Decoder Based Approach for Anomaly Detection with Application in Additive Manufacturing

We present a novel unsupervised deep learning approach that utilizes the encoder-decoder architecture for detecting anomalies in sequential sensor data collected during industrial manufacturing. Our approach is designed not only to detect whether there exists an anomaly at a given time step, but also to predict what will happen next in the (sequential) process. We demonstrate our approach on a dataset collected from a real-world testbed. The dataset contains images collected under both normal conditions and synthetic anomalies. We show that the encoder-decoder model is able to identify the injected anomalies in a modern manufacturing process in an unsupervised fashion. In addition, it also gives hints about the temperature non-uniformity of the testbed during manufacturing, which is what we are not aware of before doing the experiment.

cs.LG↗