arXiv subjects

Yoshiyuki Tsusaka

Publications and source records attributed to Yoshiyuki Tsusaka.

2 recordsLinked to original sources

arXiv2026

Comprehensive determination of Burgers vectors of threading dislocations in GaN substrates by combining reflection and transmission synchrotron-radiation x-ray topography

Burgers vectors (b) of threading dislocations (TDs) in an acidic ammonothermal-grown GaN substrate were investigated using synchrotron radiation x-ray topography (SR-XRT) by combining both reflection and transmission modes. Reflection XRT images recorded with six equivalent g vectors of 11-24 revealed spot-like contrasts corresponding to TDs. Based on the contrast conditions, the possible Burgers vectors were constrained, and the c-axis component of b for mixed-type TDs was estimated from the contrast size. Using transmission XRT images recorded under several two-beam diffraction conditions, the (0001) in-plane direction of b was evaluated based on the gb invisibility criterion. Furthermore, by analyzing the linewidths of dislocation images observed under kinematical diffraction contrast, the magnitude of the a-axis component of b was determined. By combining these analyses, the Burgers vectors of individual TDs, including edge- and mixed-type dislocations, were determined. In addition, a pair of screw-type TDs with opposite Burgers vectors, +1c, -1c, was observed in the transmission SR-XRT. These results demonstrate that the combined use of reflection and transmission SR-XRT provides a practical approach for complete determination of Burgers vectors in GaN substrates.

cond-mat.mtrl-sci↗

arXiv2026

Kinematical and dynamical contrast of dislocations in thick GaN substrates observed by synchrotron-radiation X-ray topography under six-beam diffraction conditions

Dislocations in a thick ammonothermal GaN substrate were investigated using synchrotron-radiation X-ray topography (SR-XRT) under six-beam diffraction conditions. The high brilliance of the synchrotron source enabled the observation of the super-Borrmann effect, which markedly enhanced the anomalous transmission of X-rays through the 350~$μ$m-thick crystal. Systematic variation of the deviation angle~$Δω$ revealed a clear transition from kinematical to dynamical diffraction, consistent with theoretical predictions based on dynamical diffraction theory. By selectively exciting five equivalent two-beam diffraction conditions near the six-beam configuration, the Burgers vectors of individual threading edge dislocations (TEDs) were determined according to the $g\cdot b$ invisibility criterion. The measured dislocation image widths agreed well with calculated values derived from the extinction distance and $|g\cdot b|$ dependence, confirming that most dislocations possess Burgers vectors containing an $a$-type component of $\frac{1}{3}\langle 11\bar{2}0\rangle$ or $\frac{2}{3}\langle 11\bar{2}0\rangle$. These results demonstrate that SR-XRT under multibeam diffraction provides a powerful, nondestructive method for quantitative dislocation analysis in thick GaN crystals, offering valuable insights into defect structures critical for high-performance GaN-based electronic devices.

cond-mat.mtrl-sci↗