arXiv subjects

Yuda Zhao

Publications and source records attributed to Yuda Zhao.

4 recordsLinked to original sources

arXiv2025

Ultralow-pressure mechanical-motion switching of ferroelectric polarization

Ferroelectric polarization switching, achieved by mechanical forces, enables the storage of stress information in ferroelectrics, and holds promise for human-interfacing applications. The prevailing mechanical approach is locally induced flexoelectricity with large strain gradients. However, this approach usually requires huge mechanical pressures, which greatly impedes device applications. Here, we report an approach of using triboelectric effect to mechanically, reversibly switch ferroelectric polarization across {\alpha}-In2Se3 ferroelectric memristors. Through contact electrification and electrostatic induction effects, triboelectric units are used to sensitively detect mechanical forces and generate electrical voltage pulses to trigger {\alpha}-In2Se3 resistance switching. We realize multilevel resistance states under different mechanical forces, by which a neuromorphic stress system is demonstrated. Strikingly, we achieve the reversal of {\alpha}-In2Se3 ferroelectric polarization with a record-low mechanical pressure of ~ 10 kPa, and even with tactile touches. Our work provides a fundamental but pragmatic strategy for creating mechanical-tactile ferroelectric memory devices.

cond-mat.mtrl-sci↗

arXiv2022

Charge Crowding in Graphene-Silicon Diodes

The performance of nanoscale electronic devices based on a two-three dimensional (2D-3D) interface is significantly affected by the electrical contacts that interconnect these materials with external circuitry. This work investigates charge transport effects at the 2D-3D ohmic contact coupled with the thermionic injection model for graphene/Si Schottky junction. Here, w e focus on the intrinsic properties of graphene-metal contacts, paying particular attention to the nature of the contact failure mechanism under high electrical stress. According to our findings, severe current crowding (CC) effects in highly conductive electrical contact significantly affect device failure that can be reduced by spatially varying the contact properties and geometry. The impact of electrical breakdown on material degradation is systematically analyzed by atomic force, Raman, scanning electron, and energy dispersive X-ray spectroscopies. Our devices withstand high electrostatic discharge spikes over a longer period, manifesting high robustness and operational stability. This research paves the way towards a highly robust and reliable graphene/Si heterostructure in futuristic on-chip integration in dynamic switching. The methods we employed here can be extended for other nanoscale electronic devices based on 2D-3D interfaces

physics.app-ph↗

arXiv2020

Sublinear-Time Non-Adaptive Group Testing with $O(k \log n)$ Tests via Bit-Mixing Coding

The group testing problem consists of determining a small set of defective items from a larger set of items based on tests on groups of items, and is relevant in applications such as medical testing, communication protocols, pattern matching, and many more. While rigorous group testing algorithms have long been known with runtime at least linear in the number of items, a recent line of works has sought to reduce the runtime to ${\rm poly}(k \log n)$, where $n$ is the number of items and $k$ is the number of defectives. In this paper, we present such an algorithm for non-adaptive probabilistic group testing termed {\em bit mixing coding} (BMC), which builds on techniques that encode item indices in the test matrix, while incorporating novel ideas based on erasure-correction coding. We show that BMC achieves asymptotically vanishing error probability with $O(k \log n)$ tests and $O(k^2 \cdot \log k \cdot \log n)$ runtime, in the limit as $n \to \infty$ (with $k$ having an arbitrary dependence on $n$). This closes a recently-proposed open problem of simultaneously achieving ${\rm poly}(k \log n)$ decoding time using $O(k \log n)$ tests without any assumptions on $k$. In addition, we show that the same scaling laws can be attained in a commonly-considered noisy setting, in which each test outcome is flipped with constant probability.

cs.IT↗

arXiv2019

Cross-Sender Bit-Mixing Coding

Scheduling to avoid packet collisions is a long-standing challenge in networking, and has become even trickier in wireless networks with multiple senders and multiple receivers. In fact, researchers have proved that even {\em perfect} scheduling can only achieve $\mathbf{R} = O(\frac{1}{\ln N})$. Here $N$ is the number of nodes in the network, and $\mathbf{R}$ is the {\em medium utilization rate}. Ideally, one would hope to achieve $\mathbf{R} = Θ(1)$, while avoiding all the complexities in scheduling. To this end, this paper proposes {\em cross-sender bit-mixing coding} ({\em BMC}), which does not rely on scheduling. Instead, users transmit simultaneously on suitably-chosen slots, and the amount of overlap in different user's slots is controlled via coding. We prove that in all possible network topologies, using BMC enables us to achieve $\mathbf{R}=Θ(1)$. We also prove that the space and time complexities of BMC encoding/decoding are all low-order polynomials.

cs.IT↗