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Yuezhou Luo

Publications and source records attributed to Yuezhou Luo.

2 recordsLinked to original sources

Order in disorder: increased carrier mobility of downscaled amorphous semiconductors for high-speed thin film transistors in flexible electronics

Amorphous semiconductors are important channel semiconductors in thin film transistors (TFTs) which serve not only active-matrix displays, but also flexible electronics for Internet of Things (IoT) applications. Nevertheless, a great limitation of amorphous semiconductors is their low carrier mobilities relative to their monocrystalline counterparts. Based on a recently established band fluctuation framework [Y. Luo and A. Flewitt, Phys. Rev. B 109, 104203 (2024)], this paper shows that the intrinsic carrier mobility of amorphous semiconductors can significantly increase simply through device downscaling, without any material-level optimizations. Specifically, it is revealed that the intrinsic electron mobility of hydrogenated amorphous silicon in a 10-nm long gap can increase by around 12 times, and does not compromise device-to-device uniformity. This mobility improvement is a result of reduced localized band tail states due to the ultra-short gap length relative to the band fluctuation length scale before downscaling; the latter is determined by the short- and medium-range structural order of the amorphous semiconductor.

physics.app-ph

Revisiting multiple trapping and release electronic transport in amorphous semiconductors exemplified by a-Si:H

Multiple trapping and release (MTR) is a typical transport mechanism of electron carriers in amorphous and other disordered semiconductors where localized states are significant. Quantitative description of MTR, however, has been based on an "abrupt" mobility edge model, which relies on two underpinning simplifications: (i) states above the conduction band mobility edge are extended and any of them is omnipresent in space, whereas states below the mobility edge are localized and they exist in space as pointlike sites; (ii) all states are evenly distributed in space, and the local density of states (DOS) distribution is spatially invariant. The prequel to this paper [Y. Luo and A. J. Flewitt, Phys. Rev. B 109, 104203 (2024)] demonstrates that neither of these simplifications is valid. Hence, this paper reinvestigates MTR transport. Through a probabilistic analysis of the microscopic charge transport details, this paper rigorously demonstrates that, first, the experimentally measured mobility edge is an effective quantity which is different from the actual critical energy that demarcates extended states and localized states of an amorphous semiconductor. Second, the experimentally derived extended-state mobility is also an effective quantity which turns out to be higher than the actual mobility of free electrons in the material. The hydrogenated amorphous silicon (a-Si:H) discussed in the prequel, being an intensively studied sample in the past, is used as an example to concretize the analysis.

cond-mat.dis-nn