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Yuki Shibazaki

Publications and source records attributed to Yuki Shibazaki.

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Development of an Extensible Unified Control System Using the STARS Framework and Common Commands for Detector Control

Two Fresnel zone plates zooming optics have been successfully developed and installed at the AR-NE1A beamline of the Photon Factory at the high energy accelerator research organization (KEK) in Japan. To ensure the reliable and versatile operation of this optical instrumentation, a dedicated control architecture has been implemented based on the simple transmission and retrieval system (STARS) framework, incorporating the newly proposed STARS common commands for detector control (CCDC) -- a detector-specific data acquisition (DAQ) state and command system. This system serves as both a practical control system for zooming optics and a demonstration model for modular extensibility using the STARS framework and inter-operability among detector systems enabled by the CCDC command set. The system has been commissioned, and its performance has been verified at the AR NE1A beamline. The control architecture affords enhanced configurational flexibility for optical components and provides an interface appropriate for both routine users and advanced experimental protocols.

physics.ins-det

Recent application studies of an INTPIX4NA SOIPIX detector-based X-ray camera using an SiTCP-XG 10GbE-based high-speed readout system at KEK facilities

The Silicon-On-Insulator PIXel (SOIPIX) detector is a unique monolithic structure imaging device currently being developed by the SOIPIX group, led by the High Energy Accelerator Research Organization (KEK). Our detector team at the KEK Photon Factory (PF) has developed an X-ray camera based on the INTPIX4NA SOIPIX detector. This detector provides a sensitive area of 14.1 $\times$ 8.7 $\mathrm{mm^2}$, with 425,984 pixels arranged in an 832-column $\times$ 512-row matrix and a pixel size of 17 $\times$ 17 $\mathrm{\mu m^{2}}$, and offers high spatial resolution and excellent sensitivity under low-intensity X-ray conditions. The readout system used in the X-ray camera is developed at the PF. It is equipped with SiTCP-XG, a 10 Gb Ethernet network controller implemented on a field-programmable gate array, enabling high-frame-rate imaging at several hundred hertz. We are currently investigating the applicability of this X-ray camera in several experiments at KEK. Herein, we report three recent application studies: (1) X-ray zooming microscope optics using two Fresnel zone plates at PF AR-NE1A; (2) phase-contrast X-ray imaging system using a two-crystal X-ray interferometer at PF BL-14C; and (3) nondestructive lithium detection in Li-ion battery electrode materials using muonic X-rays at J-PARC MLF Muon D2.

physics.ins-det

Development of a new phase-retrieval algorithm from a single-shot image for X-ray schlieren microscopy

In this paper, a new phase-retrieval algorithm from an X-ray schlieren image is proposed. The schlieren method allows phase-contrast imaging with an objective lens and a knife-edge filter placed at the back focal plane of the objective. This method finds a wide range of applications in the visible-light region for transparent specimen visualization. The schlieren contrast does not directly correspond to the phase shift. However, the phase map can be reconstructed from a single-shot schlieren image of a transparent and weak-phase object using the filtered Fourier transform method. A proof-of-principle experiment was performed in the hard-X-ray region at the AR-NE1A beamline of the Photon Factory facility at the High Energy Accelerator Research Organization (KEK).

physics.ins-det

X-ray imaging camera using INTPIX4NA SOIPIX detector with SiTCP-XG 10GbE based high-speed readout system

The silicon-on-insulator pixel (SOIPIX) detector is a unique monolithic-structure imaging device currently being developed by the SOIPIX group led by the High Energy Accelerator Research Organization (KEK). The detector team at KEK Photon Factory (PF) is also developing an X-ray camera using INTPIX4NA with a 14.1 $\times$ 8.7 $\mathsf{mm^2}$ sensitive area and 425,984 (832 column $\times$ 512 row matrix) pixels, with a pixel size of 17 $\times$ 17 $\mathsf{\mu m^2}$. The detector has high resolution and sensitivity for low-intensity X-rays, making it suitable for imaging in optical systems with lower X-ray intensities, such as an X-ray zooming microscope using two Fresnel zone plates (FZPs), which is also under development at PF. To enable imaging under such conditions, we developed a detector cooling system using a Peltier element to support longer exposure time (~0.5 seconds per frame). Additionally, we developed a new readout system using DAQ boards developed by PF, equipped with SiTCP-XG (network controller implemented on field-programmable gate array) that supports 10 Gbps Ethernet for high-frame-rate imaging at several hundred hertz. The new X-ray camera was tested at the PF BL-14A, BL-14B, and AR-NE1A experimental stations, and the resolution and sensitivity characteristics were confirmed. Given these confirmed characteristics, this X-ray camera is suitable for X-ray imaging using 5--20 keV X-rays under low-intensity, low-contrast conditions. These conditions are ideal for capturing soft tissues with poor contrast, objects with fine structures, and specimens vulnerable to radiation damage.

physics.ins-det