arXiv subjects

Yunseok Kim

Publications and source records attributed to Yunseok Kim.

At least 19 recordsLinked to original sources

arXiv2025

Materials Discovery in Combinatorial and High-throughput Synthesis and Processing: A New Frontier for SPM

For over three decades, scanning probe microscopy (SPM) has been a key method for exploring material structures and functionalities at nanometer and often atomic scales in ambient, liquid, and vacuum environments. Historically, SPM applications have predominantly been downstream, with images and spectra serving as a qualitative source of data on the microstructure and properties of materials, and in rare cases of fundamental physical knowledge. However, the fast-growing developments in accelerated material synthesis via self-driving labs and established applications such as combinatorial spread libraries are poised to change this paradigm. Rapid synthesis demands matching capabilities to probe structure and functionalities of materials on small scales and with high throughput. SPM inherently meets these criteria, offering a rich and diverse array of data from a single measurement. Here, we overview SPM methods applicable to these emerging applications and emphasize their quantitativeness, focusing on piezoresponse force microscopy, electrochemical strain microscopy, conductive, and surface photovoltage measurements. We discuss the challenges and opportunities ahead, asserting that SPM will play a crucial role in closing the loop from material prediction and synthesis to characterization.

cond-mat.mtrl-sci↗

arXiv2022

Size Effect of Local Current-Voltage Characteristics of MX$_2$ Nanoflakes: Local Density of States Reconstruction from Scanning Tunneling Microscopy Experiments

Local current-voltage characteristics for low-dimensional transition metal dichalcogenides (LD-TMD), as well as the reconstruction of their local density of states (LDOS) from scanning tunneling microscopy (STM) experiments is of fundamental interest and can be useful for advanced applications. Most of existing models are either hardly applicable for the LD-TMD of complex shape (e.g., those based on Simmons approach), or necessary for solving an ill-defined integral equation to deconvolute the unknown LDOS (e.g., those based on Tersoff approach). Using a serial expansion of Tersoff formulae, we propose a flexible method how to reconstruct the LDOS from local current-voltage characteristics measured in STM experiments. We established a set of key physical parameters, which characterize the tunneling current of a STM probe - sample contact and the sample LDOS expanded in Gaussian functions. Using a direct variational method coupled with a probabilistic analysis, we determine these parameters from the STM experiments for MoS2 nanoflakes with different number of layers. The main result is the reconstruction of the LDOS in a relatively wide energy range around a Fermi level, which allows insight in the local band structure of LD-TMDs. The reconstructed LDOS reveals pronounced size effects for the single-layer, bi-layer and three-layer MoS$_2$ nanoflakes, which we relate with low dimensionality and strong bending/corrugation of the nanoflakes. We hope that the proposed elaboration of the Tersoff approach allowing LDOS reconstruction will be of urgent interest for quantitative description of STM experiments, as well as useful for the microscopic physical understanding of the surface, strain and bending contribution to LD-TMDs electronic properties.

cond-mat.mtrl-sci↗

arXiv2021

Flexoelectric and piezoelectric coupling in a bended MoS$_2$ monolayer

Low-dimensional (LD) transition metal dichalcogenides (TMDs) in the form of nanoflakes, which consist of one or several layers, are the subject of intensive fundamental and applied research. Due to the size-induced transition from a bulk to nanoscale, they can be both nonpolar, piezoelectric or even ferroelectric. Also, in terms of electronic properties, they can be direct-band semiconductors, semi-metals or even metals. The tuning of the electronic properties in the LD-TMDs are commonly related with applied strains and strain gradients, which can affect strongly their polar properties via the piezoelectric and flexoelectric couplings. Using the density functional theory (DFT) and phenomenological Landau approach, we studied the bended 2H-MoS$_2$ monolayer and analyzed its flexoelectric and piezoelectric properties. The dependences of the dipole moment, strain and strain gradient on the coordinate along the layer were calculated. From these dependences the components of the flexoelectric and piezoelectric tensors have been determined and analyzed. Obtained results are useful for applications of LD-TMDs in strain engineering and flexible electronics.

cond-mat.mtrl-sci↗

arXiv2020

Correlation between corrugation-induced flexoelectric polarization and conductivity of low-dimensional transition metal dichalcogenides

Tunability of polar and semiconducting properties of low-dimensional transition metal dichalcogenides (TMDs) have propelled them to the forefront of fundamental and applied physical research. These materials can vary from non-polar to ferroelectric, and from direct-band semiconductor to metallic. However, in addition to classical controls such as composition, doping, and field effect in TMDs the additional degrees of freedom emerge due to the curvature-induced electron redistribution and associated changes in electronic properties. Here we numerically explore the elastic and electric fields, flexoelectric polarization and free charge density for a TMD nanoflake placed on a rough substrate with a sinusoidal profile of the corrugation using finite element modelling. Numerical results for different flake thickness and corrugation depth yield insight into the flexoelectric nature of the out-of-plane electric polarization and establish the unambiguous correlation between the polarization and static conductivity modulation caused by inhomogeneous elastic strains coupled with deformation potential and strain gradients, which evolve in TMD nanoflake due to the adhesion between the flake surface and corrugated substrate. We revealed a pronounced maximum at the thickness dependences of the electron and hole conductivity of MoS2 and MoTe2 nanoflakes placed on a metallic substrate, which opens the way for their geometry optimization towards significant improvement their polar and electronic properties, necessary for their advanced applications in nanoelectronics and memory devices.Specifically, obtained results can be useful for elaboration of nanoscale straintronic devices based on the bended MoS2, MoTe2 and MoSTe nanoflakes, such as diodes and bipolar transistors with a bending-controllable sharpness of p-n junctions.

cond-mat.mtrl-sci↗

arXiv2020

Selective laser ablation of metal thin films using ultrashort pulses

Selective thin-film removal is needed in many microfabrication processes such as 3-D patterning of optoelectronic devices and localized repairing of integrated circuits. Various wet or dry etching methods are available, but laser machining is a tool of green manufacturing as it can remove thin films by ablation without use of toxic chemicals. However, laser ablation causes thermal damage on neighboring patterns and underneath substrates, hindering its extensive use with high precision and integrity. Here, using ultrashort laser pulses of sub-picosecond duration, we demonstrate an ultrafast mechanism of laser ablation that leads to selective removal of a thin metal film with minimal damage on the substrate. The ultrafast laser ablation is accomplished with the insertion of a transition metal interlayer that offers high electron-phonon coupling to trigger vaporization in a picosecond timescale. This contained form of heat transfer permits lifting off the metal thin-film layer while blocking heat conduction to the substrate. Our ultrafast scheme of selective thin film removal is analytically validated using a two-temperature model of heat transfer between electrons and phonons in material. Further, experimental verification is made using 0.2 ps laser pulses by micropatterning metal films for various applications.

physics.app-ph↗

arXiv2020

Flexo-induced ferroelectricity in low dimensional transition metal dichalcogenides

We developed a Landau type theory for the description of polar phenomena in low-dimensional transition metal dichalcogenides (TMDs), specifically exploring flexoelectric origin of the polarization induced by a spontaneous bending and by inversion symmetry breaking due to the interactions with substrate. We consider the appearance of the spontaneous out-of-plane polarization due to the flexoelectric coupling with the strain gradient of the spontaneous surface rippling and surface-induced piezoelectricity. Performed calculations proved that the out-of-plane spontaneous polarization, originated from flexoelectric effect in a rippled TMD, is bistable and reversible by a non-uniform electric field. In contrast, the spontaneous polarization induced by a misfit strain and symmetry-sensitive surface-induced piezoelectric coupling, cannot be reversed by an external electric field. The special attention is paid to the spectral analysis of the linear dielectric susceptibility and gain factor, which enhancement is critically important for the observation of the polar phenomena in low-dimensional TMDs by the surface-enhanced vibrational spectroscopy.

cond-mat.mtrl-sci↗

arXiv2020

Electrostatic effect on off-field ferroelectric hysteresis loop in piezoresponse force microscopy

Piezoresponse force microscopy (PFM) has been extensively utilized as a versatile and an indispensable tool to understand and analyze nanoscale ferro- /piezoelectric properties by detecting the local electromechanical response on a sample surface. However, it has been discovered that the electromechanical response not only originates from piezoelectricity but also from other factors such as the electrostatic effect. In this study, we explore the dependence of off-field PFM hysteresis loops on the surface-potential-induced electrostatic effect in a prototypical ferroelectric thin film by applying an external voltage to the bottom electrode during measurement. We simplify the situation by equating the surface potential to the direct current voltage waveform variations and predicting the contribution of the surface-potential-induced electrostatic effect to the PFM hysteresis loops. The experimental results approximately match our prediction-the coercive voltage linearly decreases with the surface potential, whereas the saturated amplitude and piezoresponse remain nearly constant owing to the relatively large piezoelectric coefficient of the ferroelectric thin film.

physics.app-ph↗

arXiv2019

Phase Diagrams of Single Layer Two-Dimensional Transition Metal Dichalcogenides: Landau Theory

Single layer (SL) two-dimensional transition metal dichalcogenides (TMDs), such as MoS2, ReS2, WSe2, and MoTe2 have now become the focus of intensive fundamental and applied researches due to their intriguing and tunable physical properties. These materials exhibit a broad range of structural phases that can be induced via elastic strain, chemical doping, and electrostatic field effect. These transitions in turn can open and close the band gap of SL-TMDs, leading to metal-insulator transitions, and lead to emergence of more complex quantum phenomena. These considerations necessitate detailed understanding of the mesoscopic mechanisms of these structural phase transitions. Here we develop the Landau-type thermodynamic description of SL-TMDs on example of SL-(MoS2)1-x-(ReS2)x system and analyze the free energy surfaces, phase diagrams, and order parameter behavior. Our results predict the existence of multiple structural phases with 2-, 6- and 12-fold degenerated energy minima for in-plane and out of plane order parameters. This analysis suggests that out-of-plane ferroelectricity can exist in many of these phases, with the switchable polarization being proportional to the out-of-plane order parameter. We further predict that the domain walls in SL-(MoS2)1-x-(ReS2)x should become conductive above a certain strain threshold.

cond-mat.mtrl-sci↗

arXiv2019

Room Temperature Ferroelectric Ferromagnet in 1D Tetrahedral Chain Network

Ferroelectricity occurs in crystals with broken spatial inversion symmetry. In conventional perovskite oxides, concerted ionic displacements within a three-dimensional network of transition metal-oxygen polyhedra (MOx) manifest spontaneous polarization. Meanwhile, some two-dimensional networks of MOx can foster geometric ferroelectricity with magnetism, owing to the distortion of the polyhedra. Because of the fundamentally different mechanism of ferroelectricity in a two-dimensional network, one can further challenge an uncharted mechanism of ferroelectricity in a one-dimensional channel of MOx and estimate its feasibility. This communication presents ferroelectricity and coupled ferromagnetism in a one-dimensional FeO4 tetrahedral chain network of a brownmillerite SrFeO2.5 epitaxial thin film. The result provides a new paradigm for designing low-dimensional MOx networks, which is expected to benefit the realization of macroscopic ferro-ordering materials including ferroelectric ferromagnets.

cond-mat.mtrl-sci↗

arXiv2018

Ferroelectric polarization rotation in order-disorder-type LiNbO3 thin films

The direction of ferroelectric polarization is prescribed by the symmetry of the crystal structure. Therefore, rotation of the polarization direction is largely limited, despite the opportunity it offers in understanding important dielectric phenomena such as piezoelectric response near the morphotropic phase boundaries and practical applications such as ferroelectric memory. In this study, we report the observation of continuous rotation of ferroelectric polarization in order-disorder type LiNbO3 thin films. The spontaneous polarization could be tilted from an out-of-plane to an in-plane direction in the thin film by controlling the Li vacancy concentration within the hexagonal lattice framework. Partial inclusion of monoclinic-like phase is attributed to the breaking of macroscopic inversion symmetry along different directions and the emergence of ferroelectric polarization along the in-plane direction.

physics.app-ph↗

arXiv2018

Possible Electrochemical Origin of Ferroelectricity in HfO2 Thin Films

Recent observations of unusual ferroelectricity in thin films of HfO_2 and related materials have attracted broad interest to the materials and led to the emergence of a number of competing models for observed behaviors. Here we develop the electrochemical mechanism of observed ferroelectric-like behaviors, namely the collective phenomena of elastic and electric dipoles originated from oxygen vacancies formation in the vicinity of film surfaces, as well as from grain boundaries and other types of inhomogeneities inside the film. The ferroelectric phase is induced by the "electrochemical" coupling, that is the joint action of the omnipresent electrostriction and "chemical" pressure, which lead to the sign change of the positive coefficient alfa in the quadratic term alfa*P^2 in the order-disorder type thermodynamic functional depending on polarization P. Negative coefficient alfa becomes the driving force of the transition to the long-range ordered ferroelectric phase with the spontaneous polarization P in the direction normal to the film surface. Using the above ideas, we estimated that the reversible ferroelectric polarization, as high as (0.05 - 0.2) C/m^2, can be induced by oxygen vacancies in HfO_2 films of thickness less than (20 - 30) nm. Semi-quantitative agreement with available experimental data is demonstrated.

cond-mat.mtrl-sci↗

arXiv2017

Direct Probing of Polarization Charges at the Nanoscale

Ferroelectric materials possess spontaneous polarization that can be used for multiple applications. Owing to a long term development for reducing the sizes of devices, the preparation of ferroelectric materials and devices are entering nanometer-scale regime. Accordingly, to evaluate the ferroelectricity, there is a need to investigate the polarization charge at the nanoscale. Nonetheless, it has been generally accepted that the detection of polarization charges using a conventional conductive atomic force microscopy (CAFM) without a top electrode is not feasible because the nanometer-scale radius of an atomic force microscopy (AFM) tip yields a very low signal-to-noise ratio. However, the detection is unrelated to the radius of an AFM tip, and in fact, a matter of the switched area. In this work, we demonstrate the direct probing of the polarization charge at the nanoscale using the Positive-Up-Negative-Down method based on the conventional CAFM approach without additional corrections or circuits to reduce the parasitic capacitance. We successfully probed the polarization charge densities of 73.7 and 119.0 uC/cm2 in ferroelectric nanocapacitors and thin films, respectively. The obtained results show the feasibility of the evaluation of the polarization charge at the nanoscale and provide a new guideline for evaluating the ferroelectricity at the nanoscale.

cond-mat.mtrl-sci↗

arXiv2017

Ex-situ atomic force microscopy on the growth mode of SrRuO3 epitaxial thin film

The functional properties of devices based on perovskite oxides depend strongly on the growth modes that dramatically affect surface morphology and microstructure of the hetero-structured thin films. To achieve atomically flat surface morphology, which is usually a necessity for the high quality devices, understanding of the growth mechanism of heteroepitaxial thin film is indispensable. In this study, we explore heteroepitaxial growth kinetics of the SrRuO3 using intermittent growth scheme of pulsed laser epitaxy and ex-situ atomic force microscopy. Two significant variations in surface roughness during deposition of the first unit cell layer were observed from atomic force microscopy indicating the possible formation of the half unit cell of the SrRuO3 before the complete formation of the first unit cell. In addition, layer-by-layer growth mode dominated during the first two unit cell layer deposition of the SrRuO3 thin film. Our observation provides underlying growth mechanism of the heteroepitaxial SrRuO3 thin film on the SrTiO3 substrate during the initial growth of the thin film.

cond-mat.mtrl-sci↗

arXiv2017

Non-piezoelectric effects in piezoresponse force microscopy

Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the cantilever dynamics of an atomic force microscopy. However, several non-piezoelectric effects can induce additional contributions to the EM response, which often lead to a misinterpretation of the measured PFM response. This review aims to summarize the non-piezoelectric origins of the EM response that impair the interpretation of PFM measurements. We primarily discuss two major non-piezoelectric origins, namely, the electrostatic effect and electrochemical strain. Several approaches for differentiating the ferroelectric contribution from the EM response are also discussed. The review suggests a undamental guideline for the proper utilization of the PFM technique, as well as for achieving a reasonable interpretation of observed PFM responses.

cond-mat.mtrl-sci↗

arXiv2016

Surface Screening Mechanisms in Ferroelectric Thin Films and its Effect on Polarization Dynamics and Domain Structures

For over 70 years, ferroelectric materials have been remaining one of the central research topics for condensed matter physics and material science, the interest driven both by fundamental science and applications. However, ferroelectric surfaces, the key component of ferroelectric films and nanostructures, still present a significant theoretical and even conceptual challenge. Indeed, stability of ferroelectric phase per se necessitates screening of polarization charge. At surfaces, this can lead to coupling between ferroelectric and semiconducting properties of material, or with surface (electro) chemistry, going well beyond classical models applicable for ferroelectric interfaces. In this review, we summarize recent studies of surface screening phenomena in ferroelectrics. We provide a brief overview of the historical understanding of physics of ferroelectric surfaces, and existing theoretical models that both introduce screening mechanisms and explore the relationship between screening and relevant aspects of ferroelectric functionalities starting from phase stability itself. Given that majority of ferroelectrics exist in multiple-domain states, we focus on local studies of screening phenomena using scanning probe microscopy techniques. We discuss recent studies of static and dynamic phenomena on ferroelectric surfaces, as well as phenomena observed under lateral transport, light, chemical, and pressure stimuli. We also note that the need for ionic screening renders polarization switching a coupled physical-electrochemical process, and discuss the non-trivial phenomena such as chaotic behavior during domain switching that stem from this.

cond-mat.mtrl-sci↗

arXiv2016

Flexocoupling impact on the size effects of piezo- response and conductance in mixed-type ferroelectrics-semiconductors under applied pressure

Flexocoupling impact on the size effects of the spontaneous polarization, effective piezo-response, elastic strain and compliance, carrier concentration and piezo-conductance have been calculated in thin films of ferroelectric semiconductors with mixed-type conductivity under applied pressure. Analysis of the self-consistent calculation results revealed that the thickness dependences of aforementioned physical quantities, calculated at zero and nonzero flexoelectric couplings, are very similar under zero applied pressure, but become strongly different under the application of external pressure pext. At that the differences become noticeably stronger for the film surface under compression than under tension. The impact of the Vegard mechanism on the size effects is weaker in comparison with flexocoupling except for the thickness dependence of the piezo-conductance. Without flexoelectric coupling the studied physical quantities manifest conventional peculiarities that are characteristic of the size-induced phase transitions. Namely, when the film thickness h approaches the critical thickness hcr the transition to paraelectric phase occurs. The combined effect of flexoelectric coupling and external pressure induces polarizations at the film surfaces, which cause the electric built-in field that destroys the thickness-induced phase transition to paraelectric phase at h= hcr and induces the electret-like state with irreversible spontaneous polarization at h<hcr. The built-in field leads to noticeable increase of the average strain and elastic compliance under the film thickness decrease below hcr that scales as 1/h at small thicknesses h. The changes of the electron concentration by several orders of magnitude under positive or negative pressures can lead to the occurrence of high- or low-conductivity states, i.e. the nonvolatile piezo-resistive switching.

cond-mat.mtrl-sci↗

arXiv2015

Surface properties of atomically flat poly-crystalline SrTiO3

Comparison between single- and the poly-crystalline structures provides essential information on the role of long-range translational symmetry and grain boundaries. In particular, by comparing single- and poly-crystalline transition metal oxides (TMOs), one can study intriguing physical phenomena such as electronic and ionic conduction at the grain boundaries, phonon propagation, and various domain properties. In order to make an accurate comparison, however, both single- and poly-crystalline samples should have the same quality, e.g., stoichiometry, crystallinity, thickness, etc. Here, by studying the surface properties of atomically flat poly-crystalline SrTiO3 (STO), we propose an approach to simultaneously fabricate both single- and poly-crystalline epitaxial TMO thin films on STO substrates. In order to grow TMOs epitaxially with atomic precision, an atomically flat, single-terminated surface of the substrate is a prerequisite. We first examined (100), (110), and (111) oriented single-crystalline STO surfaces, which required different annealing conditions to achieve atomically flat surfaces, depending on the surface energy. A poly-crystalline STO surface was then prepared at the optimum condition for which all the domains with different crystallographic orientations could be successfully flattened. Based on our atomically flat poly-crystalline STO substrates, we envision expansion of the studies regarding theTMOdomains and grain boundaries.

cond-mat.mtrl-sci↗

arXiv2013

Space charge dynamics in solid electrolytes with steric effect and Vegard stresses: resistive switching and ferroelectric-like hysteresis of electromechanical response

We performed self-consistent modelling of electrotransport and electromechanical response of solid electrolyte thin films allowing for steric effects of mobile charged defects (ions, protons or vacancies), electron degeneration and Vegard stresses. We establish correlations between the features of the space-charge dynamics, current-voltage and bending-voltage curves in the wide frequency range of applied electric voltage. The pronounced ferroelectric-like hysteresis of bending-voltage loops and current maxima on double hysteresis current-voltage loops appear for the electron-open electrodes. The double hysteresis loop with pronounced humps indicates the resistance switching of memristor-type. The switching occurs due to the strong coupling between electronic and ionic subsystem. The sharp meta-stable maximum of the electron density appears near one open electrode and moves to another one during the periodic change of applied voltage. Our results can explain the nature and correlation of electrical and mechanical memory effects in thin films of solid electrolytes. The analytical expression proving that the electrically induced bending of solid electrolyte films can be detected by interferometric methods is derived.

cond-mat.mtrl-sci↗