arXiv subjects

Zijiang Yang

Publications and source records attributed to Zijiang Yang.

57 records · Page 4Linked to original sources

arXiv2018

Automated Localization for Unreproducible Builds

Reproducibility is the ability of recreating identical binaries under pre-defined build environments. Due to the need of quality assurance and the benefit of better detecting attacks against build environments, the practice of reproducible builds has gained popularity in many open-source software repositories such as Debian and Bitcoin. However, identifying the unreproducible issues remains a labour intensive and time consuming challenge, because of the lacking of information to guide the search and the diversity of the causes that may lead to the unreproducible binaries. In this paper we propose an automated framework called RepLoc to localize the problematic files for unreproducible builds. RepLoc features a query augmentation component that utilizes the information extracted from the build logs, and a heuristic rule-based filtering component that narrows the search scope. By integrating the two components with a weighted file ranking module, RepLoc is able to automatically produce a ranked list of files that are helpful in locating the problematic files for the unreproducible builds. We have implemented a prototype and conducted extensive experiments over 671 real-world unreproducible Debian packages in four different categories. By considering the topmost ranked file only, RepLoc achieves an accuracy rate of 47.09%. If we expand our examination to the top ten ranked files in the list produced by RepLoc, the accuracy rate becomes 79.28%. Considering that there are hundreds of source code, scripts, Makefiles, etc., in a package, RepLoc significantly reduces the scope of localizing problematic files. Moreover, with the help of RepLoc, we successfully identified and fixed six new unreproducible packages from Debian and Guix.

cs.SE↗

arXiv2017

What Causes My Test Alarm? Automatic Cause Analysis for Test Alarms in System and Integration Testing

Driven by new software development processes and testing in clouds, system and integration testing nowadays tends to produce enormous number of alarms. Such test alarms lay an almost unbearable burden on software testing engineers who have to manually analyze the causes of these alarms. The causes are critical because they decide which stakeholders are responsible to fix the bugs detected during the testing. In this paper, we present a novel approach that aims to relieve the burden by automating the procedure. Our approach, called Cause Analysis Model, exploits information retrieval techniques to efficiently infer test alarm causes based on test logs. We have developed a prototype and evaluated our tool on two industrial datasets with more than 14,000 test alarms. Experiments on the two datasets show that our tool achieves an accuracy of 58.3% and 65.8%, respectively, which outperforms the baseline algorithms by up to 13.3%. Our algorithm is also extremely efficient, spending about 0.1s per cause analysis. Due to the attractive experimental results, our industrial partner, a leading information and communication technology company in the world, has deployed the tool and it achieves an average accuracy of 72% after two months of running, nearly three times more accurate than a previous strategy based on regular expressions.

cs.SE↗

arXiv2010

Electron transport through Al-ZnO-Al: an {\it ab initio} calculation

The electron transport properties of ZnO nano-wires coupled by two aluminium electrodes were studied by {\it ab initio} method based on non-equilibrium Green's function approach and density functional theory. A clearly rectifying current-voltage characteristics was observed. It was found that the contact interfaces between Al-O and Al-Zn play important roles in the charge transport at low bias voltage and give very asymmetric I-V characteristics. When the bias voltage increases, the negative differential resistance occurs at negative bias voltage. The charge accumulation was calculated and its behavior was found to be well correlated with the I-V characteristics. We have also calculated the electrochemical capacitance which exhibits three plateaus at different bias voltages which may have potential device application.

cond-mat.mes-hall↗