SearcharxivSearch

arXiv subjects

Zuopu Zhou

Publications and source records attributed to Zuopu Zhou.

3 recordsLinked to original sources

Eliminating Leakage in Volatile Memory with Anti-Ferroelectric Transistors

Cache serves as a temporary data memory module in many general-purpose processors and domain-specific accelerators. Its density, power, speed, and reliability play a critical role in enhancing the overall system performance and quality of service. Conventional volatile memories, including static random-access memory (SRAM) and embedded dynamic random-access memory (eDRAM) in the complementary metal-oxide-semiconductor technology, have high performance and good reliability. However, the inherent leakage in both SRAM and eDRAM hinders further improvement towards smaller feature sizes and higher energy efficiency. Although the emerging nonvolatile memories can eliminate the leakage efficiently, the penalties of lower speed and degraded reliability are significant. This article reveals a new opportunity towards leakage-free volatile static memory beyond the known paradigms of existing volatile and nonvolatile memories. By engineering a double-well energy landscape with the assistance of a clamping voltage bias, leakage-free and refresh-free state retention of volatile memory is achieved for the first time. This new memory is highlighted by both the ultra-low leakage of nonvolatile memories and the speed, energy, and reliability advantages of volatile memories. A proof-of-concept memory is demonstrated using in-house anti-ferroelectric field-effect transistors (AFeFETs), delivering an extrapolated endurance of about 1012 cycles, a retention time of over 10 years, and no subthreshold channel leakage current. Such a new concept of AFeFET-based memory enables an improved balance between density, power, and reliability beyond all existing memory solutions.

cs.ET

Computational Associative Memory with Amorphous InGaZnO Channel 3D NAND-Compatible FG Transistors

3D NAND enables continuous NAND density and cost scaling beyond conventional 2D NAND. However, its poly-Si channel suffers from low mobility, large device variations, and instability caused by grain boundaries. Here, we overcome these drawbacks by introducing an amorphous indium-gallium-zinc-oxide (a-IGZO) channel, which has the advantages of ultra-low OFF current, back-end-of-line compatibility, higher mobility and better uniformity than poly-Si, and free of grain boundaries due to the amorphous nature. Ultra-scaled floating-gate (FG) transistors with a channel length of 60 nm are reported, achieving the highest ON current of 127 uA/um among all reported a-IGZO-based flash devices for high-density, low-power, and high-performance 3D NAND applications. Furthermore, a non-volatile and area-efficient ternary content-addressable memory (TCAM) with only two a-IGZO FG transistors is experimentally demonstrated. Array-level simulations using experimentally calibrated models show that this design achieves at least 240x array-size scalability and 2.7-fold reduction in search energy than 16T-CMOS, 2T2R, and 2FeFET TCAMs.

cond-mat.mes-hall

A Novel Non-Volatile Inverter-based CiM: Continuous Sign Weight Transition and Low Power on-Chip Training

In this work, we report a novel design, one-transistor-one-inverter (1T1I), to satisfy high speed and low power on-chip training requirements. By leveraging doped HfO2 with ferroelectricity, a non-volatile inverter is successfully demonstrated, enabling desired continuous weight transition between negative and positive via the programmable threshold voltage (VTH) of ferroelectric field-effect transistors (FeFETs). Compared with commonly used designs with the similar function, 1T1I uniquely achieves pure on-chip-based weight transition at an optimized working current without relying on assistance from off-chip calculation units for signed-weight comparison, facilitating high-speed training at low power consumption. Further improvements in linearity and training speed can be obtained via a two-transistor-one-inverter (2T1I) design. Overall, focusing on energy and time efficiencies, this work provides a valuable design strategy for future FeFET-based computing-in-memory (CiM).

cond-mat.mes-hall