arXiv subjects

Zuxin Ye

Publications and source records attributed to Zuxin Ye.

3 recordsLinked to original sources

arXiv2005

Quantized conductance observed in reversible atomic contacts fabricated by template electroplating using an on-membrane anode

We report a new template electroplating method for fabricating reversible atomic contacts between a single nanowire and a macroscopic contact pad. In comparison to typical template methods using a standing-alone anode, we directly evaporate the anode on one of the porous membrane surfaces. Single nanowires, upon emerging from the pores, make reversible atomic contacts with the on-membrane anode via a self-terminating mechanism. Quantized conductance steps have been observed in a controlled fashion during deposition and dissolution. This method can potentially be applied for the controlled fabrication and integration of nanowires, point contacts, and nanosized interconnects in template-based nanofabrication.

cond-mat.mtrl-sci↗

arXiv2005

Enhanced flux pinning in YBa2Cu3O7-d films by nano-scaled substrate surface roughness

Nano-scaled substrate surface roughness is shown to strongly influence the critical current density Jc in YBCO films made by pulse-laser-deposition on the crystalline LaAlO3 substrates consisting of two separate twin-free and twin-rich regions. The nano-scaled corrugated surface was created in the twin-rich region during the deposition process. Using magneto-optical imaging techniques coupled with optical and atomic force microscopy, we observed an enhanced flux pinning in the YBCO films in the twin-rich region, resulted in \~30% increase in Jc, which was unambiguously confirmed by the direct transport measurement.

cond-mat.supr-con↗

arXiv2005

Response of fractal penetration of magnetic flux to disorder landscape in superconducting films

Magnetic flux front and induction contours in superconducting YBa2Cu3O7-d films with defect size s ~ l (superconducting coherence length) and s > l are studied by magneto-optical imaging. Robust self-affine spatial correlation was observed using scaling analysis in the small pinning-dominated (s ~ l) disorderd films. The roughness exponent was determined to be ~ 0.66, independent of numbers of defects (or the film thickness). When the disorder landscape also included a distribution of large defects (s >> l), the flux front and induction contours exhibited self-similarity, with a fractal dimension to be ~ 1.33 using the box-counting method. The remarkably different flux penetration patterns were shown to be the manifestation of self-organized criticality at different length scales.

cond-mat.supr-con↗