@misc{indiciae0040084b17ac,
  title = {Controlling surface statistical properties using bias voltage: Atomic force microscopy and stochastic analysis},
  author = {P. Sangpour and G. R. Jafari and O. Akhavan and A. Z. Moshfegh and M. Reza Rahimi Tabar},
  year = {2007},
  doi = {10.1103/physrevb.71.155423},
  url = {https://arxiv.org/abs/0704.1029},
  note = {Source identifier: 0704.1029}
}