TY  - RPRT
TI  - Controlling surface statistical properties using bias voltage: Atomic force microscopy and stochastic analysis
AU  - P. Sangpour
AU  - G. R. Jafari
AU  - O. Akhavan
AU  - A. Z. Moshfegh
AU  - M. Reza Rahimi Tabar
PY  - 2007
DO  - 10.1103/physrevb.71.155423
UR  - https://arxiv.org/abs/0704.1029
ID  - 0704.1029
ER  -