TY  - RPRT
TI  - Universal temperature scaling of flux line pinning in high-temperature superconducting thin films
AU  - J Albrecht
AU  - M Djupmyr
AU  - S Bruck
PY  - 2007
DO  - 10.1088/0953-8984/19/21/216211
UR  - https://arxiv.org/abs/0704.2112
ID  - 0704.2112
ER  -