TY  - RPRT
TI  - Modelling Thickness-Dependence of Ferroelectric Thin Film Properties
AU  - L. Palova
AU  - P. Chandra
AU  - K. M. Rabe
PY  - 2007
DO  - 10.1103/physrevb.76.014112
UR  - https://arxiv.org/abs/0704.2752
ID  - 0704.2752
ER  -