TY  - RPRT
TI  - Measuring the Capacitance of Individual Semiconductor Nanowires for Carrier Mobility Assessment
AU  - Ryan Tu
AU  - Li Zhang
AU  - Yoshio Nishi
AU  - Hongjie Dai
PY  - 2007
DO  - 10.1021/nl070378w
UR  - https://arxiv.org/abs/0705.2579
ID  - 0705.2579
ER  -