@misc{indiciae92b0787aee1e,
  title = {Structural Determination of Nanocrystalline Si Films Using Ellipsometry and Raman Spectroscopy},
  author = {Sanjay K. Ram and Md. N. Islam and P. Roca i Cabarrocas and Satyendra Kumar},
  year = {2007},
  doi = {10.1016/j.tsf.2007.12.113},
  url = {https://arxiv.org/abs/0707.0228},
  note = {Source identifier: 0707.0228}
}