TY  - RPRT
TI  - Structural Determination of Nanocrystalline Si Films Using Ellipsometry and Raman Spectroscopy
AU  - Sanjay K. Ram
AU  - Md. N. Islam
AU  - P. Roca i Cabarrocas
AU  - Satyendra Kumar
PY  - 2007
DO  - 10.1016/j.tsf.2007.12.113
UR  - https://arxiv.org/abs/0707.0228
ID  - 0707.0228
ER  -