@misc{indiciaee28594bbdbd2,
  title = {Discriminant Analysis and Secondary-Beam Charge Recognition},
  author = {J. Lukasik and P. Adrich and T. Aumann and C. O. Bacri and T. Barczyk and R. Bassini and S. Bianchin and C. Boiano and A. S. Botvina and A. Boudard and J. Brzychczyk and A. Chbihi and J. Cibor and B. Czech and J. -E. Ducret and H. Emling and J. Frankland and M. Hellstroem and D. Henzlova and G. Imme and I. Iori and H. Johansson and K. Kezzar and A. Lafriakh and A. Le Fevre and E. Le Gentil and Y. Leifels and J. Luehning and W. G. Lynch and U. Lynen and Z. Majka and M. Mocko and W. F. J. Mueller and A. Mykulyak and M. De Napoli and H. Orth and A. N. Otte and R. Palit and P. Pawlowski and A. Pullia and G. Raciti and E. Rapisarda and H. Sann and C. Schwarz and C. Sfienti and H. Simon and K. Summerer and W. Trautmann and M. B. Tsang and G. Verde and C. Volant and M. Wallace and H. Weick and J. Wiechula and A. Wieloch and B. Zwieglinski},
  year = {2007},
  doi = {10.1016/j.nima.2008.01.071},
  url = {https://arxiv.org/abs/0707.0598},
  note = {Source identifier: 0707.0598}
}