TY  - RPRT
TI  - Real space information from Fluctuation electron microscopy: Applications to amorphous silicon
AU  - Parthapratim Biswas
AU  - Raymond Atta-Fynn
AU  - S. Chakraborty
AU  - D. A. Drabold
PY  - 2007
DO  - 10.1088/0953-8984/19/45/455202
UR  - https://arxiv.org/abs/0707.4012
ID  - 0707.4012
ER  -