TY  - RPRT
TI  - Analysis of atomic depth profiles directly extracted from Rutherford backscattering data for co-sputtered and ion irradiated Au-Ni films
AU  - D. Datta
AU  - S. R. Bhattacharyya
PY  - 2007
UR  - https://arxiv.org/abs/0707.4235
ID  - 0707.4235
ER  -