@misc{indiciaeebdf7c22e55a,
  title = {Path to finding the critical thickness for memory in thin ferroelectric films},
  author = {A. M. Bratkovsky and A. P. Levanyuk},
  year = {2008},
  url = {https://arxiv.org/abs/0708.3273},
  note = {Source identifier: 0708.3273}
}