TY  - RPRT
TI  - Thickness-dependence of the electronic properties in V2O3 thin films
AU  - C. Grygiel
AU  - Ch. Simon
AU  - B. Mercey
AU  - W. Prellier
AU  - P. Limelette
AU  - R. Fresard
PY  - 2007
DO  - 10.1063/1.2824465
UR  - https://arxiv.org/abs/0709.0692
ID  - 0709.0692
ER  -