TY  - RPRT
TI  - Predicting the Ionization Threshold for Carriers in Excited Semiconductors
AU  - David Snoke
PY  - 2007
DO  - 10.1016/j.ssc.2008.01.012
UR  - https://arxiv.org/abs/0709.1415
ID  - 0709.1415
ER  -