@misc{indiciae6e0d2bbeaa83,
  title = {Microscopic thickness determination of thin graphite films formed on SiC from quantized oscillation in reflectivity of low-energy electrons},
  author = {H. Hibino and H. Kageshima and F. Maeda and M. Nagase and Y. Kobayashi and H. Yamaguchi},
  year = {2007},
  doi = {10.1103/physrevb.77.075413},
  url = {https://arxiv.org/abs/0710.0469},
  note = {Source identifier: 0710.0469}
}