TY  - RPRT
TI  - Microscopic thickness determination of thin graphite films formed on SiC from quantized oscillation in reflectivity of low-energy electrons
AU  - H. Hibino
AU  - H. Kageshima
AU  - F. Maeda
AU  - M. Nagase
AU  - Y. Kobayashi
AU  - H. Yamaguchi
PY  - 2007
DO  - 10.1103/physrevb.77.075413
UR  - https://arxiv.org/abs/0710.0469
ID  - 0710.0469
ER  -