@misc{indiciaee22c5775f5ba,
  title = {Analysis of Critical State Response in Thin Films by ac Susceptibility Measurements},
  author = {A. Youssef and Z. Svindrych and J. Hadac and Z. Janu},
  year = {2007},
  doi = {10.1109/tasc.2008.922391},
  url = {https://arxiv.org/abs/0710.3891},
  note = {Source identifier: 0710.3891}
}