TY  - RPRT
TI  - Analysis of Critical State Response in Thin Films by ac Susceptibility Measurements
AU  - A. Youssef
AU  - Z. Svindrych
AU  - J. Hadac
AU  - Z. Janu
PY  - 2007
DO  - 10.1109/tasc.2008.922391
UR  - https://arxiv.org/abs/0710.3891
ID  - 0710.3891
ER  -