@misc{indiciaedeb208db049e,
  title = {On-Chip Test Infrastructure Design for Optimal Multi-Site Testing of System Chips},
  author = {Sandeep Kumar Goel and Erik Jan Marinissen},
  year = {2007},
  url = {https://arxiv.org/abs/0710.4687},
  note = {Source identifier: 0710.4687}
}