@misc{indiciaea86c843addaa,
  title = {Improving the Process-Variation Tolerance of Digital Circuits Using Gate Sizing and Statistical Techniques},
  author = {Osama Neiroukh and Xiaoyu Song},
  year = {2007},
  url = {https://arxiv.org/abs/0710.4713},
  note = {Source identifier: 0710.4713}
}