@misc{indiciaedd3419f9386f,
  title = {Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown},
  author = {Jonathan R. Carter and Sule Ozev and Daniel J. Sorin},
  year = {2007},
  url = {https://arxiv.org/abs/0710.4715},
  note = {Source identifier: 0710.4715}
}