TY  - RPRT
TI  - Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown
AU  - Jonathan R. Carter
AU  - Sule Ozev
AU  - Daniel J. Sorin
PY  - 2007
UR  - https://arxiv.org/abs/0710.4715
ID  - 0710.4715
ER  -