TY  - RPRT
TI  - Simulation Methodology for Analysis of Substrate Noise Impact on Analog / RF Circuits Including Interconnect Resistance
AU  - C. Soens
AU  - G. Van Der Plas
AU  - P. Wambacq
AU  - S. Donnay
PY  - 2007
UR  - https://arxiv.org/abs/0710.4723
ID  - 0710.4723
ER  -