@misc{indiciae81294e047139,
  title = {Modeling and Analysis of Loading Effect in Leakage of Nano-Scaled Bulk-CMOS Logic Circuits},
  author = {Saibal Mukhopadhyay and Swarup Bhunia and Kaushik Roy},
  year = {2007},
  url = {https://arxiv.org/abs/0710.4729},
  note = {Source identifier: 0710.4729}
}