TY  - RPRT
TI  - Modeling and Analysis of Loading Effect in Leakage of Nano-Scaled Bulk-CMOS Logic Circuits
AU  - Saibal Mukhopadhyay
AU  - Swarup Bhunia
AU  - Kaushik Roy
PY  - 2007
UR  - https://arxiv.org/abs/0710.4729
ID  - 0710.4729
ER  -