@misc{indiciae9225b58341ab,
  title = {Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality},
  author = {Matthias Beck and Olivier Barondeau and Martin Kaibel and Frank Poehl and Xijiang Lin and Ron Press},
  year = {2007},
  url = {https://arxiv.org/abs/0710.4763},
  note = {Source identifier: 0710.4763}
}