TY  - RPRT
TI  - Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality
AU  - Matthias Beck
AU  - Olivier Barondeau
AU  - Martin Kaibel
AU  - Frank Poehl
AU  - Xijiang Lin
AU  - Ron Press
PY  - 2007
UR  - https://arxiv.org/abs/0710.4763
ID  - 0710.4763
ER  -