@misc{indiciaeceb0c22d8a38,
  title = {Temperature measurement of sub-micrometric ICs by scanning thermal microscopy},
  author = {S. Gomès and Po Chapuis and F. Nepveu and N. Trannoy and S. Volz and B. Charlot and Gilles Tessier and S. Dilhaire and Bernard Cretin and Pascal Vairac},
  year = {2007},
  doi = {10.1109/tcapt.2007.901748},
  url = {https://arxiv.org/abs/0711.4530},
  note = {Source identifier: 0711.4530}
}