TY  - RPRT
TI  - In situ x-ray diffraction study of epitaxial growth of ordered Fe3Si films
AU  - Bernd Jenichen
AU  - Vladimir Kaganer
AU  - Wolfgang Braun
AU  - Roman Shayduk
AU  - Bradley Tinkham
AU  - Jens Herfort
PY  - 2007
DO  - 10.1007/s10854-007-9530-z
UR  - https://arxiv.org/abs/0712.2180
ID  - 0712.2180
ER  -