TY  - RPRT
TI  - Extended-Source Effect and Chromaticity in Two-Point-Mass Microlensing
AU  - Ondrej Pejcha
AU  - David Heyrovsky
PY  - 2008
DO  - 10.1088/0004-637x/690/2/1772
UR  - https://arxiv.org/abs/0712.2217
ID  - 0712.2217
ER  -