TY  - RPRT
TI  - Dependence of resistivity on surface profile in nanoscale metal films and wires
AU  - Baruch Feldman
AU  - Rui Deng
AU  - Scott T. Dunham
PY  - 2007
DO  - 10.1063/1.2937085
UR  - https://arxiv.org/abs/0712.2633
ID  - 0712.2633
ER  -