TY  - RPRT
TI  - Effect of Edge Roughness on Electronic Transport in Graphene Nanoribbon Channel Metal Oxide Semiconductor Field-Effect Transistors
AU  - D. Basu
AU  - M. J. Gilbert
AU  - L. F. Register
AU  - A. H. MacDonald
AU  - S. K. Banerjee
PY  - 2007
DO  - 10.1063/1.2839330
UR  - https://arxiv.org/abs/0712.3068
ID  - 0712.3068
ER  -