TY  - RPRT
TI  - Critical behavior of magnetic thin films as a function of thickness
AU  - X. T. Pham Phu
AU  - V. Thanh Ngo
AU  - H. T. Diep
PY  - 2007
UR  - https://arxiv.org/abs/0712.3181
ID  - 0712.3181
ER  -