TY  - RPRT
TI  - First-principles modeling of strain in perovskite ferroelectric thin films
AU  - Oswaldo Diéguez
AU  - David Vanderbilt
PY  - 2008
DO  - 10.1080/01411590802233388
UR  - https://arxiv.org/abs/0801.4071
ID  - 0801.4071
ER  -